Back to results
US 9,791,378 B2Granted
Method and apparatus for automatic measurement of various qualities of printed sheets
AssigneeElectronics for Imaging, Inc.
InventorLuc Choulet
Life of this patent
Estimating the term…
Abstract
Embodiments of the invention relate to the automatic measuring of such qualities of a printed sheet as reflectance excluding specular reflectance, reflectance including specular reflectance, e.g. gloss, transmittance, half-tone coverage, and the like.
Claims14
A computer implemented method for automatic substrate detection, comprising:
- with a spectral sensor, automatically detecting what type of substrate is in a printer by measuring each of reflectance, transparency, and gloss from a plurality of angles using a light source comprising any of one visible light source similar to daylight or at least two colored light sources;
- responsive to said substrate detection, any of automatically loading a new technical setup into said printer and providing a warning to a user;
- wherein a combination of all information obtained by said measurements results in a unique ID for each substrate;
- and
- processing said measurements to estimate any of:
- substrate color [REFCLR];
- substrate opacity [TRINT];
- substrate gloss/mat scale [GULVL];
- and
- substrate roughness or texture [TXTLVL].
7 more elements
An apparatus for automatic substrate detection, comprising:
- a spectral sensor for automatically detecting what type of substrate is in a printer by measuring each of reflectance, transparency, and gloss from a plurality of angles using a light source comprising any of one visible light source similar to daylight or at least two colored light sources;
- a processor configured for, responsive to said substrate detection, any of automatically loading a new technical setup into said printer and providing a warning to a user;
- said processor configured for a combination of all information obtained by said measurements to generate a unique ID for each substrate;
- and
- said processor configured for processing said measurements to estimate any of:
- substrate color [REFCLR];
- substrate opacity [TRINT];
- substrate gloss/mat scale [GULVL];
- and
- substrate roughness or texture [TXTLVL].
7 more elements
Dependencies are inferred from the claim text.