Measurement device with multiplexed position signals
AssigneeMitutoyo Corporation
InventorsScott Allen Harsila, David William Sesko
Life of this patent
Estimating the term…
Loading patent…
AssigneeMitutoyo Corporation
InventorsScott Allen Harsila, David William Sesko
Estimating the term…
A scanning probe responsive in three axes is provided for use with a coordinate measuring machine. The scanning probe utilizes multiplexing techniques for producing X, Y and Z position signals. The X and Y position signals are indicative of a rotation of a stylus coupling portion about a rotation center, and the Z position signal is indicative of the position of the stylus coupling portion along the axial direction. The Z position signal is substantially insensitive to motion of the axial detection deflector in at least one direction that is transverse to the axial direction. The X, Y and Z position signals may be processed to determine a 3D position of a contact portion of the stylus, which may include utilizing the Z position signal in combination with known trigonometry of the scanning probe to remove axial motion cross coupling components from the X and Y position signals.
A scanning probe for use with a coordinate measuring machine, the scanning probe comprising:
A method for determining a 3D position of a contact portion of a stylus based on position signals received from a scanning probe that the stylus is attached to, the method comprising:
A system for determining a 3D position of a contact portion of a stylus based on position signals received from a scanning probe that the stylus is coupled to, the system comprising:
Dependencies are inferred from the claim text.