Determining a thickness of individual layers of a plurality of metal layers

A measurement device comprising:

• one or more processors;
• one or more non-transitory computer-readable media storing instructions that are executable by the one or more processors to:
• determine, at a first location of a component, a first combined resistance of a plurality of metal layers, wherein the plurality of metal layers comprise a first metal layer disposed on a polymer material of the component and a second metal layer disposed on the first metal layer;
• determine a first thickness of the first metal layer at the first location based at least partly on the first combined resistance and a first resistivity associated with the first metal layer;
• determine a second thickness of the second metal layer at the first location based at least partly on the first combined resistance and a second resistivity associated with the second metal layer;
• determine that the first thickness is within a first thickness range;
• determine that the second thickness is within a second thickness range;
• and
• provide an indication that the component has passed a quality control test.

A computer-implemented method, comprising:

• determining, by a first measurement device at a first location of a component, a first combined resistance of a plurality of metal layers including a first layer disposed on a polymer plastic core of the component and a second layer disposed on top of the first layer;
• determining a first set of thicknesses based at least partly on the first combined resistance and a resistivity of individual layers of the plurality of metal layers, wherein individual thicknesses of the first set of thicknesses correspond to individual layers of the plurality of metal layers at the first location;
• determining that the individual thicknesses of the first set of thicknesses satisfy individual thickness ranges;
• and
• indicating that the first set of thicknesses pass a first quality control test.