Substrate processing apparatus, substrate processing method and storage medium
AssigneeTokyo Electron Limited
InventorKenichi Yamaga
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AssigneeTokyo Electron Limited
InventorKenichi Yamaga
Estimating the term…
A substrate processing apparatus that performs a film formation process on a substrate placed on one side of a rotary table includes: a main heating mechanism configured to heat the substrate; an auxiliary heating mechanism configured to adjust an intensity of light irradiated from the auxiliary heating mechanism in an inward/outward direction of the rotary table; a temperature measurement part configured to detect a temperature distribution of the substrate in the inward/outward direction of the rotary table; a position detection part configured to detect a position of the rotary table in a rotational direction of the rotary table; and a control part configured to control the intensity of the light irradiated from the auxiliary heating mechanism based on a temperature measurement data obtained by the temperature measurement part, a data corresponding to a target temperature distribution of the substrate, and a position detection value detected by the position detection part.
A substrate processing apparatus that performs a film formation process on a substrate placed on one side of a rotary table in a vacuum container by revolving the substrate by means of the rotary table and supplying a process gas to a region on the rotary table where the substrate passes through, the substrate processing apparatus comprising:
A substrate processing method using a substrate processing apparatus that performs a film formation process on a substrate placed on one side of a rotary table in a vacuum container by revolving the substrate by means of the rotary table and supplying a process gas to a region on the rotary table where the substrate passes through, wherein the substrate processing apparatus includes an auxiliary heating mechanism installed to face the region on the rotary table where the substrate passes through and configured to adjust an intensity of a light irradiated from the auxiliary heating mechanism in an inward/outward direction of the rotary table so as to adjust a temperature distribution of the substrate by heating the substrate by irradiating the light in an absorption wavelength range of the substrate, the method comprising:
Dependencies are inferred from the claim text.