Resolution test chart for X-ray imaging system and method of fabrication

A method for measuring the spatial resolution of an X-ray imaging system comprising the following steps:

• providing a resolution test chart comprising a substrate bearing X-ray absorbent zones, whose widths and spacings are configured to allow a measurement of the resolution of the system, wherein the absorbent zones in the diverse points of a pattern have a shape of which a general direction of elevation with respect to the surface of the substrate is rotated toward a point of convergence which is the same for all the absorbent zones;
• directing an X-ray beam, diverging from signal point of convergence of the absorbent zones, towards the resolution test chart;
• using the X-ray imaging system for acquiring an image of the resolution test chart illuminated by the X-ray beam, said image comprising a pattern of lines corresponding to the absorbent zones of the resolution test chart;
• and
• measuring the contrast of said pattern of lines and deducing therefrom the spatial resolution of the X-ray imaging system.