Method of programming one-time programmable (OTP) memory device and method of testing semiconductor integrated circuit including the same
AssigneeSamsung Electronics Co., Ltd.
InventorsDo-Hoon Byun, Chang-Su Sim, Na-Rae Hong
Life of this patent
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Abstract
A method of testing a semiconductor integrated circuit including a one-time programmable (OTP) memory device is provided. A program command is transferred from a tester to the OTP memory device. Programming and a programming verification are performed with respect to OTP memory cells in the OTP memory device in response to the program command. The OTP device generates accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells. The accumulated verification result signal is transferred from the OTP memory device to the tester.
Claims20
A method of testing a semiconductor integrated circuit including a one-time programmable (OTP) memory device, the method comprising:
- transferring a program command from a tester to the OTP memory device;
- performing program and program verification steps with respect to OTP memory cells in the OTP memory device in response to the program command;
- the OTP memory device generating an accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells;
- transferring the accumulated verification result signal from the OTP memory device to the tester;
- and
- the tester determining whether to reprogram the OTP memory cells based on the accumulated verification result signal.
A method of programming a one-time programmable (OTP) memory device, the method comprising:
- performing a program and a program verification step with respect to OTP memory cells in the OTP memory device in response to a program command received from an external device;
- generating an accumulated verification result signal by accumulating program verification results with respect to the OTP memory cells at the OTP memory device;
- and
- transferring the accumulated verification result signal from the OTP memory device to the external device.
A method of programming an integrated circuit that includes one-time programmable memory, comprising:
- the integrated circuit attempting to program the one-time programmable memory up to a predetermined maximum number of times in response to a command from test equipment;
- and
- the integrated circuit providing an indication of successful programming to the test equipment before the maximum number of programming attempts have been executed.
Dependencies are inferred from the claim text.