Data management in a linear-array-based microscope slide scanner
AssigneeLeica Biosystems Imaging, Inc.
InventorsGreg J. Crandall, Ole Eichhorn, Allen H. Olson, Dirk G. Soenksen
Life of this patent
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Abstract
Systems and methods for capturing image data using a line scan camera. In an embodiment, a line scan camera captures image data of a sample as a plurality of image stripes. A processor may coarsely align two or more of the plurality of image stripes according to a synchronization process while the line scan camera is capturing at least one of the plurality of image stripes. Subsequently, the processor may also finely align the two or more image stripes using pattern matching.
Claims18
A system for capturing image data using a line scan camera, the system comprising:
- an objective lens positioned for viewing at least a portion of a sample during constant relative motion;
- a line scan camera optically coupled to the objective lens and configured to capture image data of the sample as a plurality of image stripes;
- and
- at least one processor configured to,
- while the line scan camera is capturing at least one of the plurality of image stripes of the sample, coarsely align two or more adjacent ones of the plurality of image stripes of the sample, and,
- subsequently, finely align the two or more adjacent ones of the plurality of image stripes of the sample by testing a plurality of possible X-Y offset values within overlapping regions of adjacent ones of the two or more image stripes to determine an X-Y offset pair having a maximum correlation, wherein the X-Y offset pair comprises an X-Y offset for a first one of the adjacent image stripes and an X-Y offset for a second one of the adjacent image stripes.
A method for capturing image data using a line scan camera, the method comprising:
- by a line scan camera, capturing image data of a sample as a plurality of image stripes;
- and,
- by at least one processor,
- while the line scan camera is capturing at least one of the plurality of image stripes of the sample, coarsely aligning two or more adjacent ones of the plurality of image stripes of the sample, and,
- subsequently, finely aligning the two or more adjacent ones of the plurality of image stripes of the sample by testing a plurality of possible X-Y offset values within overlapping regions of adjacent ones of the two or more image stripes to determine an X-Y offset pair having a maximum correlation, wherein the X-Y offset pair comprises an X-Y offset for a first one of the adjacent image stripes and an X-Y offset for a second one of the adjacent image stripes.
Dependencies are inferred from the claim text.