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US 9,726,566 B2Granted
Vacuum pressure gauge
AssigneeHoneywell International Inc.
InventorJoshua Dorr
Life of this patent
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Abstract
A vacuum pressure gauge is described herein. One apparatus includes an ion trap configured to trap antimatter therein in a vacuum chamber, and a controller configured to determine a lifetime of the antimatter trapped in the ion trap and determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.
Claims19
A vacuum pressure gauge, comprising:
- an ion trap configured to trap antimatter therein in a vacuum chamber;
- and
- a controller configured to:
- determine a lifetime of the antimatter trapped in the ion trap;
- and
- determine a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.
3 more elements
A method of determining pressure in a vacuum chamber, comprising:
- determining, by a controller of a vacuum pressure gauge, a lifetime of antimatter trapped in an ion trap in a vacuum chamber;
- and
- determining, by the controller, a pressure in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter.
A vacuum pressure gauge, comprising:
- an ion trap configured to trap antimatter therein in a vacuum chamber;
- and
- a controller configured to:
- determine a lifetime of the antimatter trapped in the ion trap;
- determine a quantity of particles in the vacuum chamber based, at least in part, on the determined lifetime of the antimatter;
- and
- determine a pressure in the vacuum chamber based, at least in part, on the determined quantity of particles.
4 more elements
Dependencies are inferred from the claim text.