Ion trap mass spectrometer having a curved field region
AssigneeLeco Corporation
InventorAnatoly N. Verenchikov
Life of this patent
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Abstract
An electrostatic analyzer including at least one first set of electrodes, at least one second set of electrodes, and a field free space separating the two sets of electrodes is disclosed. The two sets of electrodes form two-dimensional electrostatic fields of ion mirrors and are arranged to provide isochronous ion oscillations in an x-y plane. Both sets of electrodes are curves at a constant curvature radius R along a third locally orthogonal Z-direction to form a torroidal field region. A related method is also disclosed.
Claims25
An electrostatic analyzer comprising:
- at least one first set of electrodes forming a two-dimensional electrostatic field of an ion mirror in an X-Y plane;
- said ion mirror arranged to provide ion reflections in an X-direction;
- at least one second set of electrodes forming a two-dimensional electrostatic field in said X-Y plane;
- and
- a field free space separating said two electrode sets;
- wherein said two electrode sets are arranged to provide isochronous ion oscillations in said;
- field free space,
- wherein both of said two electrode sets are curved at constant curvature radius R along a third locally orthogonal Z-direction to form at least one toroidal field region.
A method of mass spectrometry comprising the following steps:
- forming at least one first field region of a two-dimensional electrostatic field in an X-Y plane for ion reflection in an X-direction;
- forming at least one second field region of a two-dimensional electrostatic field in said X-Y plane;
- separating said two field regions by a field-free space;
- arranging said electrostatic fields to provide isochronous ion oscillations in said X-Y plane;
- wherein both the first and the second field regions are curved at constant curvature radius R along a third locally orthogonal Z-direction to form a toroidal field region, and
- wherein an ion path per single oscillation L and an inclination angle α between a mean ion trajectory and the X-axis and measured in radians are chosen to satisfy the relation:
- R>50*L*α2.
Dependencies are inferred from the claim text.