Chemical mechanical polishing pad and method of making same
AssigneesRohm and Haas Electronic Materials CMP Holdings, Inc., Dow Global Technologies LLC
InventorsBainian Qian, Julia Kozhukh, Teresa Brugarolas Brufau, David Michael Veneziale, Yuhua Tong, Diego Lugo, Jeffrey B. Miller, George C. Jacob, Marty W. DeGroot, Tony Quan Tran, Marc R. Stack, Andrew Wank, Fengji Yeh
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