Implementing resistance defect performance mitigation using test signature directed self heating and increased voltage
AssigneeInternational Business Machines Corporation
InventorsKarl R. Erickson, Phil C. Paone, David P. Paulsen, John E. Sheets, II, Gregory J. Uhlmann
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Abstract
A method and system are provided for implementing resistive defect performance mitigation for integrated circuits. A test is generated for identifying resistive defects. A first self heating repair process is performed for repairing resistive defects. Testing is performed to identify a mitigated resistive defect and a functional integrated circuit. Responsive to identifying a resistive defect not being mitigated and a functional integrated circuit, a second repair process is performed, then testing is performed again.
Claims9
A method for implementing resistive defect performance mitigation for integrated circuits in a computer system comprising:
- providing a test generator for identifying resistive defects;
- performing a first self heating repair process for repairing resistive defects;
- performing testing to identify a mitigated resistive defect and a functional integrated circuit;
- and
- responsive to identifying a resistive defect not being mitigated and a functional integrated circuit, performing a second repair process, and repeating testing to identify a mitigated resistive defect and a functional integrated circuit.
Dependencies are inferred from the claim text.