Method and apparatus for analysis of samples

A method for examining a sample with radiation emitted from a radiation source selected from the group consisting of a neutron radiation source and an X-ray radiation source, directed to the sample carried by a sample holder via at least one beam-forming unit, detected by a detector and evaluated in an evaluating unit, which comprises the steps of:

• prior to an examination of the sample, performing, via a control device and actuating devices, at least one of orienting and positioning components coupled to the actuating devices and selected from the group consisting of the radiation source, the beam-forming unit, the sample holder, the detector, and a primary beam stop disposed upstream of the detector, in terms of at least one of a spatial location in relation to at least other ones of the components, in relation to a predefined fixed point, or in relation to an optical path;
• when performing the step of at least one of orienting and positioning the components, outputting actuating signals from the control device to the at least one actuating drive based on saved adjustment values resulting in an automatic performance of a sequence of steps that adjust spatial positions, tilts, and rotations of the components in a reproducible way;
• and
• using a radiation intensity measured by the detector or a value derived from the radiation intensity for establishing a control variable conferred from the control unit to the actuating drives assigned to the components.