Method and apparatus for sorting particles
AssigneeCytonome/St, LLC
InventorsManish Deshpande, John R. Gilbert
Life of this patent
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Abstract
A method and a system are provided for detecting particles moving through a detection region or regions for facilitating or processing a sample having one or more particles flowing through the detection region. The particle detection system may include an optically detectable pattern associated with a detection region. The optically detectable pattern may be configured to receive a particle optical signal and produce a patterned optical signal. The detection system may further include a detector configured to analyze the patterned optical signal to determine both a particle characteristic based on a property of the particle optical signal and a particle parameter based on a property of the optically detectable pattern.
Claims28
A particle detecting system comprising:
- a first flow path having a detection region adapted to facilitate analysis or processing of a sample having one or more particles flowing through the first flow path of the detection region;
- a first optically detectable pattern associated with the detection region, the first optically detectable pattern positioned to receive a particle optical signal associated with a particle flowing through the first flow path of the detection region and to produce a patterned optical signal;
- and
- a first detector positioned to receive the patterned optical signal,
- wherein the first detector is configured to analyze the patterned optical signal to independently determine both:
- (i) a particle characteristic based on a property of the particle optical signal associated with the particle flowing through the detection region;
- and
- (ii) a particle parameter based on a property of the first optically detectable pattern.
Dependencies are inferred from the claim text.