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US 9,547,094 B2Granted
X-ray analysis apparatus
AssigneePANalytical B.V.
InventorsJeroen Rinsema, Mark Alexander Pals
Life of this patent
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Abstract
X-ray analysis of a primary sample such as a flexible sheet 60 uses apparatus having a primary sample holder such as a material feed-through system 20 for moving the flexible sheet through the apparatus. An X-ray analysis head 6 containing an X-ray source and an X-ray detector is mounted on a robot arm 4. The robot arm moves in three dimensions so that the analysis head can be brought into position to measure the flexible sheet as it is being brought through the apparatus by the material feed-through system.
Claims14
Apparatus for X-ray analysis of a sample comprising:
- a primary sample holder for holding the sample;
- an X-ray analysis head containing an X-ray source and an X-ray detector, and
- a robot arm mounted on the apparatus, the X-ray analysis head being mounted on the robot arm, the robot arm being arranged to move the X-ray analysis head both linearly in three dimensions and rotationally so that the analysis head is brought into position to measure the sample;
- wherein the primary sample holder is a material feed-through system for moving a flexible sheet through the apparatus.
1 more element
Dependencies are inferred from the claim text.