Solid-state imaging device, driving method, and electronic device

A driving method of a solid-state imaging device, the solid-state imaging device including a pixel section configured to include a plurality of pixels arranged in a matrix form, the plurality of pixels performing photoelectric conversion, column signal lines configured to transmit pixel signals output from the pixels in units of columns, an analog to digital (AD) converting section configured to include a comparator that compares a reference signal serving as a ramp wave with the pixel signals transmitted via the column signal line and convert a reference level and a signal level of the pixel signals into digital signals independently based on a comparison result of the comparator, and a switch configured to be connected with the column signal lines, the driving method comprising:

• a step of, by the solid-state imaging device, turning on the switch only during a certain period of time in a period of time in which the comparator is reset and causing the column signal lines to be short-circuited,
• wherein the plurality of pixels are arranged in the pixel section to correspond to a color filter in which colors are arranged in a certain repetitive unit,
• wherein the switch is connected to each column signal line of pixels of the same color,
• wherein the switch is a transistor, and
• wherein the transistor includes a gate connected to the control section via a control line and a source and a drain that are connected to a row signal line connected to the column signal line in a row direction.

An electronic device comprising:

• a solid-state imaging device including
• a pixel section configured to include a plurality of pixels arranged in a matrix form, the plurality of pixels configured to perform photoelectric conversion,
• column signal lines configured to transmit pixel signals output from the pixels in units of columns,
• an analog to digital (AD) converting section configured to include a comparator that compares a reference signal serving as a ramp wave with the pixel signals transmitted via the column signal line and convert a reference level and a signal level of the pixel signals into digital signals independently based on a comparison result of the comparator,
• a switch configured to be connected with the column signal lines, and
• a control section configured to turn on the switch only during a certain period of time in a period of time in which the comparator is reset and cause the column signal lines to be short-circuited,
• wherein the plurality of pixels are arranged in the pixel section to correspond to a color filter in which colors are arranged in a certain repetitive unit,
• wherein the switch is connected to each column signal line of pixels of the same color,
• wherein the switch is a transistor, and
• wherein the transistor includes a gate connected to the control section via a control line and a source and a drain that are connected to a row signal line connected to the column signal line in a row direction.

A solid-state imaging device comprising:

• a pixel section configured to include a plurality of pixels arranged in a matrix form, the plurality of pixels configured to perform photoelectric conversion;
• column signal lines configured to transmit pixel signals output from the pixels in units of columns;
• an analog to digital (AD) converting section configured to include a comparator that compares a reference signal serving as a ramp wave with the pixel signals transmitted via the column signal line and convert a reference level and a signal level of the pixel signals into digital signals independently based on a comparison result of the comparator;
• a switch configured to be connected with the column signal lines;
• and
• a control section configured to turn on the switch only during a certain period of time in a period of time in which the comparator is reset and cause the column signal lines to be short-circuited,
• wherein the plurality of pixels are arranged in the pixel section to correspond to a color filter in which colors are arranged in a certain repetitive unit,
• wherein the switch is connected to each column signal line of pixels of the same color,
• wherein the switch is a transistor, and
• wherein the transistor includes a gate connected to the control section via a control line, a source connected to the column signal line, and a drain connected to a row signal line in a row direction.

A solid-state imaging device comprising:

• a pixel section configured to include a plurality of pixels arranged in a matrix form, the plurality of pixels configured to perform photoelectric conversion;
• column signal lines configured to transmit pixel signals output from the pixels in units of columns;
• an analog to digital (AD) converting section configured to include a comparator that compares a reference signal with the pixel signals transmitted via the column signal line and convert the pixel signals into digital signals independently based on a comparison result of the comparator;
• a switch configured to be connected with the column signal lines;
• and
• a control section configured to turn on the switch,
• wherein the plurality of pixels are arranged in the pixel section to correspond to a color filter,
• wherein the switch is connected to each column signal line of pixels of the same color,
• wherein the switch is a transistor, and
• wherein the transistor includes a gate connected to the control section via a control line, a source connected to one of the column signal lines, and a drain connected to another of the column signal lines.

A solid-state imaging device comprising:

• a plurality of pixels including a first pixel for detecting a first color, a second pixel for detecting a second color, a third pixel for detecting the first color, and a fourth pixel for detecting the second color, wherein the first to the fourth pixel are arranged in a same row;
• a plurality of data signal lines including a first data signal line coupled to the first pixel, a second data signal line coupled to the second pixel, a third data signal line coupled to the third pixel, and a fourth data signal line coupled to the fourth pixel;
• a reference signal generating section configured to supply a reference signal;
• a first analog to digital (AD) converting section configured to include a first comparator that compares the reference signal with a first pixel signal transmitted via the first data signal line;
• a second AD converting section configured to include a second comparator that compares the reference signal with the second pixel signal transmitted via the second data signal line;
• a third AD converting section configured to include a third comparator that compares the reference signal with the third pixel signal transmitted via the third data signal line;
• a fourth AD converting section configured to include a fourth comparator that compares the reference signal with the fourth pixel signal transmitted via the fourth data signal line;
• a first transistor configured to connect the first data signal line to the third data signal line;
• a second transistor configured to connect the second data signal line to the fourth data signal line;
• a first control line connected to a gate of the first transistor;
• and
• a second control line connected to a gate of the second transistor.