Method for testing array fuse of semiconductor apparatus
AssigneeSK hynix Inc.
InventorJae Seok Kang
Life of this patent
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Abstract
A method for testing an array fuse block of a semiconductor apparatus may include a series of operations for testing an array fuse block of the semiconductor apparatus as a test program is executed. The series operations may include the following steps: generating a test source file containing information for accessing the array fuse block; generating a test vector using the test source file; extracting repair confirmation information by performing a simulation using the test vector; extracting a repair confirmation information expected value from the test source file; and determining a pass or fail by comparing the repair confirmation information to the repair confirmation information expected value.
Claims15
A method for testing a non-transitory array fuse block of a semiconductor apparatus, wherein the non-transitory array fuse block of the semiconductor apparatus storing a test program, and when executed by a processor, causes the processor to perform method steps comprising:
- starting the test program;
- generating a test source file containing information for accessing all unit fuses of the non-transitory array fuse block;
- generating a test vector using the test source file, wherein the test vector comprises a pattern of sequentially performing boot-up, rupture, reboot-up, and normal active operations for each of unit fuses of the non-transitory array fuse block;
- extracting a repair confirmation information by performing a simulation using the test vector;
- extracting a repair confirmation information expected value from the test source file;
- and
- determining a pass or fail by comparing the repair confirmation information to the repair confirmation information expected value.
Dependencies are inferred from the claim text.