Semiconductor memory device
AssigneeKabushiki Kaisha Toshiba
InventorsToshifumi Hashimoto, Yusuke Umezawa
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AssigneeKabushiki Kaisha Toshiba
InventorsToshifumi Hashimoto, Yusuke Umezawa
Estimating the term…
A semiconductor memory device includes first and second plugs formed on a semiconductor substrate, a word line between the first and second plugs and above the semiconductor substrate, a first semiconductor pillar extending above the semiconductor substrate through the word line, a second semiconductor pillar extending above the semiconductor substrate through the word line, a first bit line electrically connected to the first semiconductor pillar, and a second bit line electrically connected to the second semiconductor pillar. When writing same data in a first memory cell, which is electrically connected to the first bit line, and a second memory cell, which is electrically connected to the second bit line, a first voltage is applied to the first bit line and a second voltage that is different from the first voltage is applied to the second bit line.
A semiconductor memory device comprising:
A semiconductor memory device comprising:
A method of writing a data having a first value in first and second memory cells of a semiconductor memory device, the semiconductor memory device including first and second plugs formed on a semiconductor substrate, a word line between the first and second plugs and above the semiconductor substrate, a first semiconductor pillar extending above the semiconductor substrate through the word line and forming a channel region of the first memory cell, a second semiconductor pillar extending above the semiconductor substrate through the word line and forming a channel region of the second memory cell, a first bit line electrically connected to the first semiconductor pillar, and a second bit line electrically connected to the second semiconductor pillar, said method comprising:
Dependencies are inferred from the claim text.