Systems and methods for error injection in data storage systems

Abstract

Embodiments of the solid-state storage system provided herein are configured to perform improved mechanisms for testing of error recovery of solid state storage devices. In some embodiments, the system is configured to introduce or inject errors into data storage commands or operations performed in the non-volatile memory. Injected errors include corruption of data stored in the non-volatile memory, deliberate failure to execute storage operations, and errors injected into communication protocols used between various elements of the device. In some embodiments, injected errors can include direct errors that trigger an immediate execution of error recovery mechanisms and delayed errors that trigger execution of error recovery mechanisms at a later time. Error recovery mechanisms can be tested in an efficient, reliable, and deterministic manner to help ensure effective operation of storage devices. The integrity of non-volatile memory can also be tested.

Dependencies are inferred from the claim text.