Event triggered prognostics
AssigneeMedtronic, Inc.
InventorsScott A. Hareland, Leonard P. Radtke
Life of this patent
Estimating the term…
Abstract
The present disclosure describes an implantable medical device utilizing an event-triggered prognostic indicator. The disclosure describes techniques for prognostics and management of implantable medical systems to facilitate continuity of performance of sensing and therapy delivery functions by providing adequate response time to handle emerging issues prior to adverse clinical impacts. In accordance with the present disclosure, event-triggered prognostic indicators facilitate the identification of potential device conditions.
Claims12
An implantable medical device having an event-triggered prognostic indicator, comprising:
- a sensor operatively configured to derive a first plurality of parameters associated with a function of the implantable medical device;
- memory configured to store information corresponding to the first plurality of parameters;
- a control module configured to:
- evaluate the first plurality of parameters to determine whether a first threshold has been exceeded, and
- activate a diagnostic evaluation of a component associated with performing the function in response to the first threshold being exceeded,
- wherein the first threshold corresponds to a potential failure of the component;
- a power source, wherein a first amount of power is drawn from the power source to derive the first plurality of parameters and a second amount of power, that is greater than the first amount, is drawn from the power source to activate the diagnostic evaluation.
An implantable medical device having an event-triggered prognostic indicator, comprising:
- a sensor operatively configured to derive a first plurality of parameters associated with a function of the implantable medical device;
- memory configured to store information corresponding to the first plurality of parameters;
- and
- a control module configured to:
- evaluate the first plurality of parameters to determine whether a first threshold has been exceeded, and
- activate a diagnostic evaluation of a component associated with performing the function in response to the first threshold being exceeded,
- wherein the first threshold corresponds to a potential failure of the component;
- wherein the first plurality of parameters provides a first degree of accuracy of the potential failure of the component and a result of the diagnostic evaluation provides a second degree of accuracy, that is greater than the first degree of accuracy, of the potential failure;
- and
- wherein the result of the diagnostic evaluation provides a prediction of the potential failure of the component.
An implantable medical device having an event-triggered prognostic indicator, comprising:
- a sensor operatively configured to derive a first plurality of parameters associated with a function of the implantable medical device;
- memory configured to store information corresponding to the first plurality of parameters;
- a control module configured to:
- evaluate the first plurality of parameters to determine whether a first threshold has been exceeded, and
- activate a diagnostic evaluation of a component associated with performing the function in response to the first threshold being exceeded,
- wherein the first threshold corresponds to a potential failure of the component;
- wherein a notification is generated in response to a prediction of the presence of the potential failure of the component;
- and
- wherein the result of the diagnostic evaluation provides a prediction of the potential failure of the component;
- and
- a power source, wherein a first amount of power is drawn from the power source to derive the first plurality of parameters and a second amount of power, that is greater than the first amount, is drawn from the power source to activate the diagnostic evaluation.
Dependencies are inferred from the claim text.