# US 9,520,775 B2 · Boosting system, diagnosing method, and computer readable medium storing diagnosing program for diagnosing the boosting functions of a boosting section

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- Number: US 9,520,775 B2
- Document ID: US9520775B2
- Status: Granted
- Kind: B2
- Application number: 13/346,942
- Filed: 2012-01-10
- Published: 2012-07-19
- Granted: 2016-12-13
- Earliest claimed: 2011-01-17
- Assignees: Lapis Semiconductor Co., Ltd.
- Applicants: Naoaki Sugimura
- Inventors: Naoaki Sugimura
- Web page: https://patentgrep.com/patent/US9520775B2

## CPC

- H02M 3/07: using capacitors charged and discharged alternately by semiconductor devices with control electrode {, e.g. charge pumps}
- G01R 19/165: Indicating that current or voltage is either above or below a predetermined value or within or outside a predetermined range of values
- G01R 31/00: Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere ({measuring superconductive properties G01R33/1238;} testing line transmission systems H04B3/46; testing or measuring semiconductors or solid state devices during manufacture {H10P74/00})
- G05F 1/10: Regulating voltage or current (G05F1/02 takes precedence)
- H02M: APPARATUS FOR CONVERSION BETWEEN AC AND AC, BETWEEN AC AND DC, OR BETWEEN DC AND DC, AND FOR USE WITH MAINS OR SIMILAR POWER SUPPLY SYSTEMS; CONVERSION OF DC OR AC INPUT POWER INTO SURGE OUTPUT POWER; CONTROL OR REGULATION THEREOF (transformers H01F; dynamo-electric converters H02K47/00; controlling transformers, reactors or choke coils, control or regulation of electric motors, generators or dynamo-electric converters H02P)
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- G05F: SYSTEMS FOR REGULATING ELECTRIC OR MAGNETIC VARIABLES

## Abstract

The present invention provides a boosting system, a diagnosing method and a diagnosing program, that may diagnose a boosting section while suppressing consumption of electric power and current, and without being carrying out by a CPU. Namely, during an initializing operation, difference between power supply voltage and own threshold voltage charges capacitor C1 of a comparison circuit, and a difference between voltage of a constant voltage and the own threshold voltage charges capacitor C2. In a comparing operation, a boosting section and the capacitor C1 are connected so that boosted voltage is inputted, and GND and the capacitor C2 are connected so that GND voltage is inputted. At this time, if output OUT is L level, it is diagnosed that there is no defect, whereas if the output OUT is H level, it is diagnosed that there is defect.

## Claims

### Claim 1

A boosting system comprising:
a boosting section that generates a boosted voltage obtained by boosting a first voltage in accordance with a second voltage outputted from a constant voltage circuit; and
a comparison circuit, to which the boosted voltage, the first voltage, the second voltage and a ground potential are input,
that compares a first difference value with a second difference value and that outputs results of comparison, wherein the first difference value is obtained from a difference between the boosted voltage and the first voltage, the second difference value is obtained from a difference between the second voltage and the ground potential,
wherein the comparison circuit comprises:
a single inverting amplifier;
a first capacitor and a second capacitor that are connected in parallel, wherein an input of the single inverting amplifier is connected to the first capacitor and the second capacitor;
a first switching element that connects the first capacitor and the boosting section such that the first voltage is inputted;
a second switching element that connects the first capacitor and the boosting section such that the boosted voltage is inputted;
a third switching element that connects the second capacitor and the boosting section such that the second voltage is inputted;
a fourth switching element that connects the second capacitor to ground such that the ground potential is inputted; and
a fifth switching element that short-circuits the input and an output of the single inverting amplifier.

### Claim 2 (depends on 1)

The boosting system of claim 1, comprising:
a reference voltage generating circuit that, on the basis of the second voltage, generates and outputs either of a first reference voltage and a second reference voltage;
a sixth switching element that connects the boosting section and the first switching element connected to the first capacitor, such that the first voltage is inputted;
a seventh switching element that connects the first switching element to ground, such that the ground potential is inputted;
an eighth switching element that connects the boosting section and the second switching element connected to the first capacitor, such that the boosted voltage is inputted; and
a ninth switching element that connects the reference voltage generating circuit and the second switching element connected to the first capacitor, such that the first reference voltage or the second reference voltage is inputted.

### Claim 3

A boosting system comprising:
a boosting section that generates a boosted voltage obtained by boosting a first voltage in accordance with a second voltage outputted from a constant voltage circuit; and
a comparison circuit, to which the boosted voltage, the first voltage, the second voltage and a ground potential are input,
that compares a third difference value with a fourth difference value and that outputs results of comparison, wherein the third difference value is obtained from a difference between the boosted voltage and the second voltage, the fourth difference value is obtained from a difference between the first voltage and the ground potential,
wherein the comparison circuit comprises:
a single inverting amplifier;
a first capacitor and a second capacitor that are connected in parallel, wherein an input of the single inverting amplifier is connected to the first capacitor and the second capacitor;
a first switching element that connects the boosting section and the first capacitor such that the second voltage is inputted;
a second switching element that connects the boosting section and the first capacitor such that the boosted voltage is inputted;
a third switching element that connects the boosting section and the second capacitor such that the first voltage is inputted;
a fourth switching element that connects the second capacitor to ground such that the ground potential is inputted; and
a fifth switching element that short-circuits the input and an output of the single inverting amplifier.

### Claim 4 (depends on 3)

The boosting system of claim 3, comprising:
a reference voltage generating circuit that, on the basis of the second voltage, generates and outputs either of a first reference voltage and a second reference voltage;
a sixth switching element that connects the boosting section and the first switching element connected to the first capacitor, such that the second voltage is inputted;
a seventh switching element that connects the first switching element to ground, such that the ground potential is inputted;
an eighth switching element that connects the boosting section and the second switching element, connected to the first capacitor, such that the boosted voltage is inputted; and
a ninth switching element that connects the reference voltage generating circuit and the second switching element connected to the first capacitor, such that the first reference voltage or the second reference voltage is inputted.

### Claim 5 (depends on 1)

The boosting system of claim 1, wherein the constant voltage circuit generates and outputs the second voltage in accordance with the first voltage.

### Claim 6 (depends on 1)

The boosting system of claim 1, comprising a detecting circuit that carries out diagnosis of the boosting section on the basis of the output from the comparison circuit.

### Claim 7 (depends on 1)

A diagnosing method comprising, in the boosting system according to claim 1:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the first voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF; and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 8 (depends on 3)

A diagnosing method comprising, in the boosting system according to claim 3:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the second voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the first voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF; and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 9 (depends on 2)

A diagnosing method comprising, in the boosting system according to claim 2:
diagnosing the boosting section, the diagnosing comprising:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the first voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF, and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF; and
diagnosing the comparison circuit, the diagnosing comprising:
switching the first switching element and the seventh switching element ON and connecting the first capacitor to the ground, and applying a difference between the ground potential and the own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the first reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the second reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF, and,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 10 (depends on 4)

A diagnosing method comprising, in the boosting system according to claim 4:
diagnosing the boosting section, the diagnosing comprising:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the second voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the first voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF, and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF; and
diagnosing the comparison circuit, the diagnosing comprising:
switching the first switching element and the seventh switching element ON and connecting the first capacitor to the ground, and applying a difference between the ground potential and the own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the first reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the second reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF, and,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 11 (depends on 1)

A non-transitory computer readable medium storing a diagnosing program for causing a computer to execute a process for self-diagnosing the boosting section of the boosting system according to claim 1, the process comprising:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the first voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF; and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 12 (depends on 3)

A non-transitory computer readable medium storing a diagnosing program for causing a computer to execute a process for self-diagnosing the boosting section of the boosting system according to claim 3, the process comprising:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the second voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the first voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited;
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF; and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 13 (depends on 2)

A non-transitory computer readable medium storing a diagnosing program for causing a computer to execute a process for self-diagnosing the boosting section and the comparison circuit of the boosting system according to claim 2, the process comprising:
diagnosing the boosting section, the diagnosing comprising:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the first voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF, and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF; and
diagnosing the comparison circuit, the diagnosing comprising:
switching the first switching element and the seventh switching element ON and connecting the first capacitor to the ground, and applying a difference between the ground potential and the own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the first reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the second reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF, and,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 14 (depends on 4)

A non-transitory computer readable medium storing a diagnosing program for causing a computer to execute a process for self-diagnosing the boosting section and the comparison circuit of the boosting system according to claim 4, the process comprising:
diagnosing the boosting section, the diagnosing comprising:
switching the first switching element ON and connecting the first capacitor and the boosting section, and applying a difference between the second voltage and an own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the first voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element ON and connecting the first capacitor and the boosting section, in a state in which the fifth switching element is OFF, and
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF; and
diagnosing the comparison circuit, the diagnosing comprising:
switching the first switching element and the seventh switching element ON and connecting the first capacitor to the ground, and applying a difference between the ground potential and the own threshold voltage of the single inverting amplifier to the first capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the third switching element ON and connecting the second capacitor and the boosting section, and applying a difference between the second voltage and the own threshold voltage of the single inverting amplifier to the second capacitor, in a state in which the fifth switching element is ON and the input and the output of the single inverting amplifier are short-circuited,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the first reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF,
switching the second switching element and the ninth switching element ON and connecting the first capacitor and the boosting section such that the second reference voltage is inputted to the first capacitor, in a state in which the fifth switching element is OFF, and,
switching the fourth switching element ON and connecting the first capacitor to the ground, in a state in which the fifth switching element is OFF.

### Claim 15 (depends on 1)

The boosting system of claim 1, comprising:
a detecting circuit that outputs control signals to control the comparison circuit based on an instruction to execute diagnosis from the exterior of the boosting system; and
a storage section that stores the logic values that are outputted from the comparison circuit so as to carry out diagnosis of the boosting section on the basis of the logic values.

### Claim 16 (depends on 3)

The boosting system of claim 3, wherein the constant voltage circuit generates and outputs the second voltage in accordance with the first voltage.

### Claim 17 (depends on 3)

The boosting system of claim 3, comprising a detecting circuit that carries out diagnosis of the boosting section on the basis of the output from the comparison circuit.

### Claim 18 (depends on 3)

The boosting system of claim 3, comprising:
a detecting circuit that outputs control signals to control the comparison circuit based on an instruction to execute diagnosis from the exterior of the boosting system; and
a storage section that stores the logic values that are outputted from the comparison circuit so as to carry out diagnosis of the boosting section on the basis of the logic values.