# US 9,520,457 B2 · Display panel and repairing method thereof > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,520,457 B2 - Document ID: US9520457B2 - Status: Granted - Kind: B2 - Application number: 14/731,814 - Filed: 2015-06-05 - Published: 2016-07-14 - Granted: 2016-12-13 - Earliest claimed: 2015-01-13 - Assignees: Samsung Display Co., Ltd. - Applicants: Samsung Display Co., Ltd. - Inventors: Dong-Yoon So; Kyong Tae Park; Mi Jin Yoon; Sung Ho Cho; Yu-Hyun Cho - Web page: https://patentgrep.com/patent/US9520457B2 ## CPC - G02F 1/1345: Conductors connecting electrodes to cell terminals - G02F 1/136259: {Repairing; Defects} - H10K 59/1213: {the pixel elements being TFTs} - H10K 59/131: Interconnections, e.g. wiring lines or terminals - H10K 59/35: comprising red-green-blue [RGB] subpixels - H10K 59/87: {Passivation; Containers; Encapsulations} - H10K 59/88: Dummy elements, i.e. elements having non-functional features - G02F 1/136272: {Auxiliary lines} - H10K 71/70: Testing, e.g. accelerated lifetime tests - H10K 71/861: {Repairing} - G02F: OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS - H10K: ORGANIC ELECTRIC SOLID-STATE DEVICES ## Abstract A display panel and a repairing method thereof are disclosed. In one aspect, the display panel includes an active area including a plurality of pixels and a plurality of signal lines. The panel also includes a repair line at least partially surrounding the active area and overlapping the signal line in the active area and a plurality of first transistors formed on a side of the active area, wherein one end of each of the first transistors overlaps the repair line. The panel further includes a sealing portion configured to seal the active area, the repair line, and the first transistors. The panel also includes a pad portion formed outside the sealing portion and including a plurality of dummy pads respectively connected to the first transistors and a plurality of driving pads respectively connected to the signal lines. ## Claims ### Claim 1 A display panel, comprising: an active area including a plurality of pixels and a plurality of signal lines; a repair line at least partially surrounding the active area and overlapping one of the plurality of signal lines in the active area; a plurality of first transistors formed on a side of the active area, wherein one end of each of the first transistors overlaps the repair line; a sealing portion configured to seal the active area, the repair line, and the first transistors; a pad portion formed outside the sealing portion and including i) a plurality of dummy pads respectively connected to the first transistors and ii) a plurality of driving pads respectively connected to the signal lines; and a plurality of test signal lines connected to the corresponding dummy and driving pads and configured to provide test signals from the dummy pads and the driving pads to the pixels. ### Claim 2 (depends on 1) The display panel of claim 1, wherein a defective one of the signal lines is electrically connected to the repair line overlapping the one of the plurality of signal lines. ### Claim 3 (depends on 2) The display panel of claim 2, wherein each of the first transistors is selectively connected to the repair line based on a type of test signal provided to the defective one of the plurality of signal lines. ### Claim 4 (depends on 2) The display panel of claim 2, wherein the defective signal line includes a defect point and a peripheral point adjacent to the defect point, and wherein the peripheral point is configured to be cut. ### Claim 5 (depends on 1) The display panel of claim 1, further comprising a plurality of second transistors each including a first end electrically connected to the corresponding dummy pad, a second end electrically connected to a corresponding test signal line, and a gate electrically connected to the first transistors and a test starting signal line configured to receive a test starting signal from outside the sealing portion. ### Claim 6 (depends on 1) The display panel of claim 1, wherein a first one of the first transistors has an end electrically connected to the repair line, and wherein a second one of the first transistors has an end isolated from the repair line based on a type of test signal provided to a defective one of the signal lines. ### Claim 7 (depends on 1) The display panel of claim 1, further comprising: a repair pad formed outside the sealing portion and connected to the repair line; and a second transistor including a first end electrically connected to the repair pad, a second end overlapping the test signal lines, and a gate electrically connected to a test starting signal line configured to receive a test starting signal from outside the sealing portion. ### Claim 8 (depends on 7) The display panel of claim 7, wherein one of the test signal lines and the second end of the corresponding second transistor are electrically connected to each other based on a type of test signal supplied to a defective one of the signal lines. ### Claim 9 A method of repairing a display panel, comprising: determining a defective one of a plurality of signal lines, wherein the display panel includes an active area including a plurality of pixels and the signal lines, a repair line at least partially surrounding the active area and overlapping the signal line and the active area, a plurality of first transistors formed on a side of the active area, wherein one end of each of the first transistors overlaps with the repair line; cutting a peripheral point adjacent to a defect point indicative of a defect in the defective one of the plurality of signal lines; selecting a first transistor of the first transistors based on a type of test signal provided to the defective signal line; and connecting the repair line to the selected first transistor based on the type of test signal. ### Claim 10 (depends on 9) The repairing method of claim 9, further comprising supplying a test starting signal at a disable level when the selected first transistor and the repair line are electrically connected to each other, wherein the display panel further includes: a sealing portion configured to seal the active area, the repair line, and the first transistors; a pad portion formed outside the sealing portion and including i) a plurality of dummy pads respectively connected to the first transistors and ii) a plurality of driving pads respectively connected to the signal lines; and a plurality of second transistors having a first end electrically connected to a corresponding dummy pad among the dummy pads, a second end electrically connected to a corresponding test signal line, and a gate electrically connected to the selected first transistor and a test starting signal line to which a test starting signal is supplied from outside the sealing portion. ### Claim 11 (depends on 9) The method of claim 9, wherein a first one of the first transistors has an end electrically connected to the repair line, and wherein a second one of the first transistors has an end isolated from the repair line based on a kind of test signal provided to the defective signal line. ### Claim 12 (depends on 9) The method of claim 9, wherein the display panel further comprises: a sealing portion configured to seal the active area, the repair line, and the first transistors; a pad portion formed outside the sealing portion and including i) a plurality of dummy pads respectively connected to the first transistors and ii) a plurality of driving pads respectively connected to the signal lines; a plurality of test signal lines connected to the corresponding dummy and driving pads and configured to provide test signals from the dummy pads and the driving pads to the pixels; a repair pad formed outside the sealing portion and connected to the repair line; and a second transistor having a first end electrically connected to the repair pad, a second end overlapping the test signal lines, and a gate electrically connected to a test starting signal line configured to receive a test starting signal from outside the sealing portion. ### Claim 13 (depends on 12) The method of claim 12, wherein one of the test signal lines and the second end of the corresponding second transistor are electrically connected to each other based on a kind of test signal supplied to the signal line with the defect. ### Claim 14 A display panel, comprising: an active area including a plurality of pixels and a plurality of signal lines electrically connected to the pixels; a repair line formed at least partially surrounding the active area and overlapping the signal line in the active area; a plurality of first transistors formed on a side of the active area, wherein one end of each of the first transistors overlaps the repair line at an overlapping point; a sealing portion configured to seal the active area, the repair line, and the first transistors, wherein the sealing portion surrounds the active area; and a pad portion formed outside the sealing portion and including i) a plurality of dummy pads respectively connected to the first transistors and ii) a plurality of driving pads respectively connected to the signal lines; a gate signal line electrically connected to the gates of the first transistors and configured to transmit a test starting signal to the first transistors; and a direct current (DC) line electrically connected to the signal lines and configured to transmit a test signal and a data signal to the pixels. ### Claim 15 (depends on 14) The display panel of claim 14, wherein a defective one of the signal lines is electrically connected to the overlapping repair line. ### Claim 16 (depends on 15) The display panel of claim 15, wherein the DC line comprises R, G, B lines respectively connected to the corresponding dummy and driving pads, wherein the R, G, B lines are configured to provide the test signal from the dummy and driving pads to the pixels, wherein each of the first transistors is selectively connected to the repair line based on a type of the test signal transmitted to the defective signal line. ### Claim 17 (depends on 15) The display panel of claim 15, wherein the defective signal line includes a defect point and a peripheral point adjacent to the defect point, and wherein the peripheral point is configured to be cut. ### Claim 18 (depends on 14) The display panel of claim 14, further comprising a plurality of second transistors having a first end electrically connected to the corresponding dummy pad, a second end electrically connected to a corresponding DC line, and a gate electrically connected to the first transistors and a gate signal line configured to receive the test starting signal from outside the sealing portion. ### Claim 19 (depends on 14) The display panel of claim 14, wherein a first one of the first transistors has an end electrically connected to the repair line and a second one of the first transistors has an end isolated from the repair line based on a type of the test signal provided to the defective signal line. ### Claim 20 (depends on 14) The display panel of claim 14, further comprising: a repair pad formed outside the sealing portion and connected to the repair line; and a second transistor including a first end electrically connected to the repair pad, a second end overlapping the DC line, and a gate electrically connected to the gate signal line configured to receive the test starting signal from outside the sealing portion.