# US 9,518,865 B2 · Device for measuring a power density distribution of a radiation source > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,518,865 B2 - Document ID: US9518865B2 - Status: Granted - Kind: B2 - Application number: 14/471,314 - Filed: 2014-08-28 - Published: 2015-03-05 - Granted: 2016-12-13 - Earliest claimed: 2013-08-28 - Assignees: JENOPTIK Optical Systems GmbH - Applicants: JENOPTIK Optical Systems GmbH - Inventors: Tobias Gnausch; Meik Panitz; Ralf Mueller; Marc Himel - Web page: https://patentgrep.com/patent/US9518865B2 ## CPC - G01J 1/4257: {applied to monitoring the characteristics of a beam, e.g. laser beam, headlamp beam (monitoring arrangements for lasers in general H01S3/0014)} - G01J 1/0407: {Optical elements not provided otherwise, e.g. manifolds, windows, holograms, gratings} - G01J 1/429: {applied to measurement of ultraviolet light (using counting tubes G01T)} - G01J: MEASUREMENT OF INTENSITY, VELOCITY, SPECTRAL CONTENT, POLARISATION, PHASE OR PULSE CHARACTERISTICS OF INFRARED, VISIBLE OR ULTRAVIOLET LIGHT; COLORIMETRY; RADIATION PYROMETRY (light sources F21, H01J, H01K, H05B; investigating properties of materials by optical means G01N) ## Abstract A device and method for measuring a power density distribution of a radiation source is provided. The device includes a radiation source designed to emit a light beam in a radiation direction; a substrate disposed downstream of the radiation source in the radiation direction and having an extent in an x-direction and a y-direction, the substrate having a first region and at least one further second region, and the first region comprises a diffractive structure designed to separate the light beam impinging on the substrate into a zeroth order of diffraction and at least one first order of diffraction; and a detector unit disposed downstream of the substrate in the radiation direction and designed to measure the intensity of the first order of diffraction transmitted through the substrate and to derive a power density distribution therefrom. ## Claims ### Claim 1 A device for measuring a power density distribution of a radiation source, the device comprising: a radiation source adapted to emit a light beam in a radiation direction; a transparent substrate disposed downstream of the radiation source in the radiation direction and having an extent in an x-direction and a y-direction, the substrate having a lesser first region and at least one further second region, the first region comprising a diffractive structure adapted to separate the light beam impinging on the diffractive structure into a zeroth order of diffraction and at least one first order of diffraction; and a detector unit disposed downstream of the substrate in the radiation direction and adapted to measure the intensity of the first order of diffraction transmitted through the diffractive structure and to derive a power density distribution therefrom, wherein the first region is configured such that only one specific portion of the light beam is separated into a zeroth order of diffraction and at least one first order of diffraction, and the substrate or the radiation source is movable and, during a movement of the substrate or of the radiation source, a multiplicity of portions of the light beam are separated into a zeroth order of diffraction and at least one first order of diffraction. ### Claim 2 (depends on 1) The device according to claim 1, wherein the substrate has a plurality of the diffractive structures, each designed to separate at least one specific portion of the light beam into a zeroth order of diffraction and at least one first order of diffraction. ### Claim 3 (depends on 2) The device according to claim 2, wherein the diffractive structures have binary grating lines with an identical orientation. ### Claim 4 (depends on 2) The device according to claim 2, wherein the diffractive structures have binary grating lines with a different orientation. ### Claim 5 (depends on 1) The device according to claim 1, wherein the radiation source is a laser radiation source having a wavelength of 343 nm. ### Claim 6 (depends on 1) The device according to claim 1, wherein the diffractive structure is a binary grating, and wherein the grating lines of the binary grating are aligned in the x- and/or y-direction. ### Claim 7 (depends on 6) The device according to claim 6, wherein the binary grating has a grating period and the grating period varies within the grating. ### Claim 8 (depends on 1) The device according to claim 1, wherein the substrate is adapted to be inclined by a specific angle and/or a surface normal with respect to the substrate and has an inclination relative to a preferred orientation of the grating. ### Claim 9 (depends on 1) The device according to claim 1, further comprising an evaluation and control unit that evaluates the data measured by the detector unit and forwards control signals to the radiation source. ### Claim 10 (depends on 1) The device according to claim 1, wherein the diffractive structure is a slit shape. ### Claim 11 (depends on 1) The device according to claim 1, wherein the diffractive structure is a rectangular shape. ### Claim 12 (depends on 1) The device according to claim 1, further comprising an optical supervisory unit. ### Claim 13 (depends on 1) A method for measuring a power density distribution of a radiation source, the method being implementable in conjunction with a device according to claim 1, the method comprising: providing a radiation source that emits a light beam in a radiation direction; providing the transparent substrate disposed downstream of the radiation source in the radiation direction and having an extent in an x-direction and a y-direction, wherein the substrate has a lesser first region and at least one further second region, the first region comprising a diffractive structure separating the light beam impinging on the diffractive structure into a zeroth order of diffraction and at least one first order of diffraction; providing a detector unit disposed downstream of the diffractive structure in the radiation direction; measuring an intensity of the first order of diffraction transmitted through the diffractive structure via the detector unit; and deriving a power density distribution from the measured intensity. ### Claim 14 (depends on 13) The method according to claim 13, wherein the zeroth order of diffraction is used for processing a workpiece, and wherein the radiation source is readjusted if the derived power density distribution does not correspond to a predefined power density distribution. ### Claim 15 (depends on 1) A method for measuring a power density distribution of a radiation source, the method being implementable in conjunction with a device according to claim 1, the method comprising: providing a radiation source that emits a light beam in a radiation direction; providing the transparent substrate disposed downstream of the radiation source in the radiation direction and having an extent in an x-direction and a y-direction, wherein the substrate has a lesser first region and at least one further second region, the first region comprising a diffractive structure separating the light beam impinging on the diffractive structure into a zeroth order of diffraction and at least one first order of diffraction wherein the first region is configured such that only one specific portion of the light beam is separated into a zeroth order of diffraction and at least one first order of diffraction; moving the radiation source or substrate in such a way that a multiplicity of portions of the light beam are separated into a zeroth order of diffraction and at least one first order of diffraction; providing a detector unit disposed downstream of the diffractive structure in the radiation direction; measuring an intensity of the first order of diffraction transmitted through the diffractive structure via the detector unit; and deriving a power density distribution from the measured intensity.