# US 9,518,851 B2 · Probes for inspection system for substantially round hole > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,518,851 B2 - Document ID: US9518851B2 - Status: Granted - Kind: B2 - Application number: 14/559,278 - Filed: 2014-12-03 - Published: 2016-06-09 - Granted: 2016-12-13 - Earliest claimed: 2014-12-03 - Assignees: General Electric Company - Applicants: General Electric Company - Inventors: Robert William Bergman; Thomas James Batzinger - Web page: https://patentgrep.com/patent/US9518851B2 ## CPC - G01D 11/30: Supports specially adapted for an instrument; Supports specially adapted for a set of instruments - G01M 15/14: Testing gas-turbine engines or jet-propulsion engines - G01N 27/9006: {Details, e.g. in the structure or functioning of sensors} - G01N 29/043: {in the interior, e.g. by shear waves} - G01N 29/225: {Supports, positioning or alignment in moving situation} - G01N 2291/2636: cylindrical from inside - G01D: MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR - G01M: TESTING STATIC OR DYNAMIC BALANCE OF MACHINES OR STRUCTURES; TESTING OF STRUCTURES OR APPARATUS, NOT OTHERWISE PROVIDED FOR - G01N: INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES (measuring or testing apparatus or processes other than immunoassay, involving enzymes or microorganisms C12M, C12Q) ## Abstract Probes for an inspection system for a substantially round hole in a material are provided. One version of the probe may include a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole; and a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole. ## Claims ### Claim 1 A probe for an inspection system for a substantially round hole in a material, the probe comprising: a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole; a plurality of sensors disposed on the flexible sheet, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole; a probe support coupled to the flexible sheet for supporting the flexible sheet relative to the substantially round hole; a handle coupled to the probe support for controlling a position of the probe; a guide support pivotally coupled to the handle at a first end of the guide support; a guide member coupled to a second end of the guide support for engaging an opposing portion of the interior of the substantially round hole from the flexible sheet; and a biasing element to bias the guide support to press the guide member against the opposing portion, the guide member movable with the flexible sheet and relative to the opposing portion to guide the flexible sheet along the portion. ### Claim 2 (depends on 1) The probe of claim 1, wherein the non-destructive signal includes one of an eddy current signal and an ultrasound signal. ### Claim 3 (depends on 1) The probe of claim 1, wherein the flexible sheet includes a polystyrene substrate. ### Claim 4 (depends on 3) The probe of claim 3, wherein the polystyrene substrate has a shape configured to substantially conform to the portion of the interior of the substantially round hole. ### Claim 5 (depends on 1) The probe of claim 1, wherein the guide member includes a wheel. ### Claim 6 (depends on 1) The probe of claim 1, wherein the flexible sheet is flexible between a first, compressed position sized to fit into an end of the substantially round hole and a second, expanded position sized to substantially conform with the portion of an interior of the substantially round hole. ### Claim 7 (depends on 1) The probe of claim 1, wherein the portion includes a substantially semi-circular portion of the interior of the substantially round hole, and the flexible sheet is sized to substantially conform with the substantially semi-circular portion of the interior of the substantially round hole. ### Claim 8 (depends on 7) The probe of claim 7, wherein the plurality of sensors extend along a line on the flexible sheet. ### Claim 9 A probe for an inspection system for a substantially round hole in a material, the probe comprising: an elongated sensor support; a bearing plate configured to rotatably support the elongated sensor support in a position in the substantially round hole; a sensor mount surface shaped to substantially conform with a portion of an interior of the substantially round hole; a plurality of sensors disposed on the sensor mount surface, each sensor configured to transmit a non-destructive signal into the material for inspecting the substantially round hole; and a biasing element coupling the sensor mount surface and the elongated sensor support, the biasing element biasing the sensor mount surface to substantially conform with the portion of the interior of the substantially round hole. ### Claim 10 (depends on 9) The probe of claim 9, wherein the non-destructive signal includes one of an eddy current signal and an ultrasound signal. ### Claim 11 (depends on 9) The probe of claim 9, wherein the sensor mount surface includes a flexible sheet shaped and biased to substantially conform with a portion of an interior of the substantially round hole. ### Claim 12 (depends on 11) The probe of claim 11, wherein the flexible sheet includes a polystyrene substrate. ### Claim 13 (depends on 9) The probe of claim 9, wherein the sensor mount surface includes a channel along a longitudinal axis thereof, and wherein the plurality of sensors are disposed within the channel. ### Claim 14 (depends on 9) The probe of claim 9, wherein the plurality of sensors extend along a longitudinal line on the sensor mount surface. ### Claim 15 (depends on 9) The probe of claim 9, wherein the bearing plate includes a mount surface configured to mate with an end of the substantially round hole to position the elongated sensor support. ### Claim 16 (depends on 9) The probe of claim 9, wherein the elongated sensor support is rotatably coupled to the bearing plate by a bearing that limits rotation of the elongated bearing support to just greater than 360°. ### Claim 17 (depends on 9) The probe of claim 9, wherein the bearing plate includes at least one passage therethrough. ### Claim 18 (depends on 9) The probe of claim 9, wherein the biasing element includes a plurality of pneumatic rams. ### Claim 19 (depends on 9) The probe of claim 9, wherein the portion includes a substantially semi-circular portion of the interior of the substantially round hole, and the sensor mount surface is sized to substantially conform with the substantially semi-circular portion of the interior of the substantially round hole.