Method and device for generating a focused strong-current charged-particle beam
AssigneesEcole Polytechnique, Centre National de la Recherche Scientifique (CNRS), Institut National de la Recherche Scientifique (INRS)
InventorsJulien Fuchs, Bruno Albertazzi, Henri Pepin, Emmanuel D'Humieres
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Abstract
The invention relates to a method for generating a focused charged-particle beam, comprising at least the steps of: a) generating a charged-particle beam (10); b) emitting a laser pulse (40); c) generating a focusing magnetic field structure in a target (50) by means of an interaction between the laser pulse and the target; and d) making the charged-particle beam penetrate the focusing magnetic field structure at least partially.
Claims11
A method for generating a focused beam of charged particles, the method comprising:
- a) generating a beam of charged particles;
- b) emitting a laser pulse;
- c) generating a focusing magnetic field structure in a target by means of an interaction of said laser pulse with said target;
- and
- d) causing at least partial penetration of the beam of charged particles into said focusing magnetic field structure,
- wherein in step b), a laser contrast of the laser pulse is increased.
A device for generating a focused beam of charged particles, the device comprising:
- means for generating a beam of charged particles;
- a laser source for emitting a laser pulse;
- a target for generating a focusing magnetic field structure by means of an interaction of said laser pulse with said target, said beam of charged particles penetrating at least partially into said magnetic field structure;
- and
- a device for increasing a laser contrast of the laser pulse.
Dependencies are inferred from the claim text.