Increasing yield with tactile button gap adjustment
AssigneeMicrosoft Technology Licensing, LLC
InventorMichael C. Gordon
Life of this patent
Estimating the term…
Abstract
Embodiments of the disclosure optimize yield of a product having one or more switch assemblies and improve impact robustness of the product without sacrificing tactile feel. Based on failure limits of a gap in the switch assembly during manufacturing, a single size for a shim is calculated. The shim is selectively inserted into the switch assembly based on the gap to maximize the switch assembly yield while minimizing cost. In some examples, a bracket is designed for the switch assemblies. The bracket has datum surfaces in three dimensions and a beam tuned to absorb energy during an impact event to prevent switch failure.
Claims20
A computing device having a switch assembly, the switch assembly comprising:
- a bracket, the bracket having a plurality of datum surfaces, in three dimensions, comprising at least two datum feet each having a height, and a beam transverse across the bracket, having a width and a thickness, wherein the plurality of datum surfaces form an impact area between a chassis of the computing device and the switch assembly, the impact area configured to absorb energy to prevent a switch failure during an impact event;
- and
- a gap configured to receive a shim of single size based on failure limits of the gap, the gap representing an amount of travel from a button to a switch actuator associated with the switch assembly, the height of the datum feet, and the width and the thickness of the beam being dynamically calculated based on the gap.
A switch assembly comprising:
- a switch actuator that, when inserted into a chassis of a computing device, is configured to receive a button;
- and
- a gap configured to receive a shim based on failure limits of the gap, a size of the shim being calculated based on the failure limits of the gap, the failure limits being determined using a simulation with a pin gauge diameter and shim thickness as inputs that vary with each simulation.
An automated method for assembling and testing a switch in a computing device, the method comprising:
- defining failure limits of a gap in a plurality of switch assemblies, wherein defining failure limits includes performing a simulation analysis with a pin gauge diameter and shim thickness as inputs that vary with each simulation analysis, each of the plurality of switch assemblies configured to receive a button, the gap in each of the plurality of switch assemblies representing an amount of travel from the button to a switch actuator;
- and
- based on the defined failure limits, calculating a single size for a shim, the single size maximizing a yield for the plurality of switch assemblies, wherein for each of the plurality of switch assemblies, the shim having the calculated single size is selectively inserted into the one of the plurality of switch assemblies based on the gap for the one of the plurality of the switch assemblies.
Dependencies are inferred from the claim text.