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US 9,497,379 B2Granted
Variable-illumination fourier ptychographic imaging devices, systems, and methods
AssigneeCalifornia Institute of Technology
InventorsXiaoze Ou, Roarke Horstmeyer, Guoan Zheng, Changhuei Yang
Life of this patent
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Abstract
Certain aspects pertain to Fourier ptychographic imaging systems, devices, and methods such as, for example, high NA Fourier ptychographic imaging systems and reflective-mode NA Fourier ptychographic imaging systems.
Claims25
An ultra-high NA Fourier ptychographic imaging system, comprising:
- a variable illuminator configured to illuminate a sample at a plurality of incidence angles at different times;
- an optical system comprising a lens with a high NA, the lens configured to filter light issuing from the sample, wherein the plurality of incidence angles and the high NA correspond to a plurality of overlapping regions in the Fourier domain that cover an expanded NA of greater than 1.0;
- and
- a radiation detector configured to acquire a plurality of intensity images, each intensity image corresponding to a different incidence angle of the plurality of incidence angles.
1 more element
A reflective-mode Fourier ptychographic imaging system, comprising:
- a variable illuminator configured to illuminate a sample at a plurality of incidence angles at different times in an epi-illumination mode;
- an optical system comprising a filtering optical element having a filtering function, the optical system configured to receive light reflected from the sample and filter the light reflected from the sample using the filtering optical element, wherein the plurality of incidence angles and the filtering function correspond to overlapping regions in the Fourier domain;
- and
- a radiation detector configured to acquire a plurality of intensity images, each intensity image corresponding to a different incidence angle of the plurality of incidence angles.
1 more element
Dependencies are inferred from the claim text.