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US 9,448,274 B2Granted
Circuitry to protect a test instrument
AssigneeTeradyne, Inc.
InventorsDouglas W. Pounds, Charles J. Carline
Life of this patent
Estimating the term…
Abstract
Controlling a test instrument may include: determining a first value corresponding to power output by the test instrument; determining a second value based on the first value, where the second value corresponds to an amount of energy consumed by the test instrument; and placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold.
Claims18
A method of controlling a test instrument;
- comprising:
- determining a first value corresponding to power output by the test instrument;
- determining a second value based on the first value, the second value corresponding to an amount of energy consumed by the test instrument;
- and
- placing at least part of the test instrument in a high-impedance state when the second value exceeds a threshold;
- wherein the test instrument comprises multiple channels;
- and
- wherein the following are performed for a channel in the test instrument:
- determining the first value, determining the second value, and placing the test instrument in the high-impedance state.
6 more elements
Circuitry to control a test instrument, comprising:
- a multiplier circuit to receive an input voltage and a voltage corresponding to an input current and to provide an output voltage representing power output of the test instrument;
- an integrator circuit to output an integrated voltage based on a current corresponding to the output voltage, the integrated voltage representing energy consumed by the test instrument;
- a comparator circuit to perform a comparison of the integrated voltage to a threshold, and to output a result signal based on the comparison;
- and
- a latch to output a control signal to the test instrument based on the result signal, the control signal to place at least one of multiple channels of the test instrument in a high-impedance state.
2 more elements
Circuitry to control a test instrument, comprising:
- an integrator circuit to output an integrated voltage based on a current corresponding primarily to an output power of the test instrument when the output power of the test instrument is above a threshold, the integrated voltage representing energy consumed by the test instrument;
- a comparator circuit to perform a comparison of the integrated voltage to a threshold, and to output a result signal based on the comparison;
- and
- a latch to output a control signal to the test instrument based on the result signal, the control signal to place at least one of multiple channels of the test instrument in a high-impedance state.
1 more element
Dependencies are inferred from the claim text.