# US 9,438,221 B2 · Switch device

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- Number: US 9,438,221 B2
- Document ID: US9438221B2
- Status: Granted
- Kind: B2
- Application number: 14/244,336
- Filed: 2014-04-03
- Published: 2015-10-08
- Granted: 2016-09-06
- Earliest claimed: 2014-04-03
- Assignees: Infineon Technologies AG
- Applicants: Infineon Technologies AG
- Inventors: Michael Asam; Veli Kartal
- Web page: https://patentgrep.com/patent/US9438221B2

## CPC

- H03K 17/122: {in field-effect transistor switches}
- H03K 17/063: {in field-effect transistor switches}
- H03K 2217/0027: Measuring means of, e.g. currents through or voltages across the switch
- H03K: PULSE TECHNIQUE (measuring pulse characteristics G01R; modulating sinusoidal oscillations with pulses H03C; transmission of digital information H04L; discriminator circuits detecting phase difference between two signals by counting or integrating cycles of oscillation H03D3/04; automatic control, starting, synchronisation or stabilisation of generators of electronic oscillations or pulses where the type of generator is irrelevant or unspecified H03L; coding, decoding or code conversion, in general H03M)

## Abstract

Switch devices with a first switching path and a second switching path are provided in some embodiments. When a voltage drop across the first switching path exceeds a predetermined voltage, the second switch may be activated.

## Claims

### Claim 1

A switch device, comprising:
a first switching path including a first input and a first output,
a second switching path including a second input and a second output,
wherein the first switching path and the second switching path are connected in parallel, the first input and the second input are configured to be connected to a supply voltage, and the first output and the second output are configured to be directly connected to a load,
wherein in a closed state a resistance of the first switching path is greater than a resistance of the second switching path, and
wherein the switch device is configured to turn the second switching path on in response to a voltage drop across the first switching path exceeding a predetermined value.

### Claim 2 (depends on 1)

The switch device of claim 1, wherein the switch device is configured to only activate the first switching path when a load current is to be sensed.

### Claim 3 (depends on 1)

The switch device of claim 1, wherein the switch device is configured to turn only the first switching path on when a load current below a predetermined threshold is to be sensed.

### Claim 4 (depends on 1)

The switch device of claim 1, wherein the switch device is further configured to turn the second switching path on outside times for load current measurements.

### Claim 5 (depends on 1)

The switch device of claim 1, further comprising a current sensing circuit coupled with the first switching path.

### Claim 6 (depends on 5)

The switch device of claim 5, wherein the current sensing circuit is further coupled with the second switching path.

### Claim 7 (depends on 1)

The switch device of claim 1, wherein the first switching path comprises a first transistor, and wherein the second switching path comprises a second transistor, the second transistor being larger than the first transistor.

### Claim 8 (depends on 7)

The switch device of claim 7, wherein the first transistor is a MOS transistor, and wherein the second transistor is a MOS transistor,
wherein a drain terminal of the first transistor is to be coupled with the supply voltage, wherein a drain terminal of the second transistor is to be coupled with the supply voltage,
wherein a source terminal of the first transistor is coupled with a source terminal of the second transistor and is to be coupled with the terminal of the load, and wherein a gate terminal of the second transistor in a first mode of operation is coupled with a charge pump and in a second mode of operation is coupled with the drain terminal of the second transistor.

### Claim 9 (depends on 8)

The switch device of claim 8, wherein in the first mode of operation the gate terminal of the second transistor is coupled to a gate terminal of the first transistor.

### Claim 10 (depends on 8)

The switch device of claim 8, wherein a gate terminal of the first transistor is coupled with a further charge pump.

### Claim 11 (depends on 8)

The switch device of claim 8, wherein the drain terminal of the second transistor is coupled with the supply voltage via at least one of a voltage modification device or a voltage modification circuit.

### Claim 12 (depends on 11)

The switch device of claim 11, wherein the voltage modification device is regulated depending on at least one of a temperature, a voltage drop across the first transistor or a current through the first transistor.

### Claim 13 (depends on 7)

The switch device of claim 7, further comprising an overcurrent detection circuit coupled to the second transistor.

### Claim 14

A switch device, comprising:
a first mode of operation with a lower resistance in a switched-on state,
a second mode of operation with a higher resistance in a switched-on state,
a switching mechanism to switch between the first mode of operation and the second mode of operation, and
a second switching mechanism different from the first switching mechanism to switch to the first mode of operation in response to an overload in the second mode of operation wherein the overload corresponds to a state causing overheating of an element in the second mode of operation.

### Claim 15 (depends on 14)

The switch device of claim 14, further comprising an evaluation/diagnosis circuit configured to measure a current through the switch device.

### Claim 16

A method, comprising:
activating only a higher ohmic switching path for current sensing at low currents,
activating a lower ohmic switching path at higher currents, and
activating the lower ohmic switching path to prevent an overload using a different activation mechanism than the activating of the lower ohmic switching path at higher currents.

### Claim 17 (depends on 16)

The method of claim 16, further comprising activating the lower ohmic switching path outside a current sensing time slot.

### Claim 18 (depends on 16)

The method of claim 16, wherein the lower ohmic switching path comprises a first transistor, and wherein the higher ohmic switching path comprises a second transistor, wherein the activating of the lower ohmic switching path to prevent overload of the higher ohmic switching path comprising activating the second transistor when a source-drain voltage of the first transistor corresponds to a threshold voltage of the second transistor.

### Claim 19 (depends on 16)

The method of claim 16, wherein the lower ohmic switching path comprises a first transistor, and wherein the higher ohmic switching path comprises a second transistor, wherein the activating of the lower ohmic switching path to prevent overload of the higher ohmic switching path comprising activating the second transistor when a combination of the source-drain voltage of the first transistor with a modification voltage corresponds to a threshold voltage of the second transistor.

### Claim 20 (depends on 19)

The method of claim 19, further comprising determining the modification voltage based on at least one of a temperature, a source-drain voltage of the first transistor and a load current.
