# US 9,437,764 B2 · Photoelectric conversion device and method for manufacturing photoelectric conversion device > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,437,764 B2 - Document ID: US9437764B2 - Status: Granted - Kind: B2 - Application number: 14/300,028 - Filed: 2014-06-09 - Published: 2014-12-18 - Granted: 2016-09-06 - Earliest claimed: 2013-06-13 - Assignees: Canon Kabushiki Kaisha - Applicants: Canon Kabushiki Kaisha - Inventors: Takanori Watanabe; Takafumi Miki; Satoko Iida; Masahiro Kobayashi; Junji Iwata - Web page: https://patentgrep.com/patent/US9437764B2 ## CPC - H10F 77/148: {Shapes of potential barriers} - H10F 39/014: {of CMOS image sensors} - H10F 39/8027: {Geometry of the photosensitive area} - H10F 39/8033: {Photosensitive area} - H10F 71/134: {Irradiation with electromagnetic or particle radiation} - H10F 39/18: Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors - Y02E 10/50: Photovoltaic [PV] energy - H10F: INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION - Y02E: REDUCTION OF GREENHOUSE GAS [GHG] EMISSIONS, RELATED TO ENERGY GENERATION, TRANSMISSION OR DISTRIBUTION ## Abstract An exemplary embodiment is a photoelectric conversion device having a photoelectric conversion portion, and a transfer portion. The transfer portion transfers charges of the photoelectric conversion portion. The photoelectric conversion portion includes first and second semiconductor regions of a first conductivity type. Charges generated by photoelectric conversion are accumulated in the first and second semiconductor regions. According to the structure of the first and second semiconductor regions of the exemplary embodiment or the method for manufacturing them, the transfer efficiency of charges can be improved while improving the sensitivity of the photoelectric conversion portion. ## Claims ### Claim 1 A photoelectric conversion device comprising: a semiconductor substrate; a photoelectric conversion portion including first and second semiconductor regions of a first conductivity type disposed in the semiconductor substrate; and a transfer portion configured to transfer charges of the first and second semiconductor regions, wherein the first semiconductor region includes a part having a lower impurity concentration than that of a different part of the first semiconductor region, wherein the part having the lower impurity concentration and the different part of the first semiconductor region are arranged along a first direction parallel to a surface of the semiconductor substrate, wherein the second semiconductor region is disposed under the part having the lower impurity concentration, the second semiconductor region and the part having the lower impurity concentration being arranged along a second direction perpendicular to the surface, and wherein a length of the first semiconductor region along the first direction is greater than a length of the second semiconductor region along the first direction, and a semiconductor region of the second conductivity type is disposed laterally to the second semiconductor region along the first direction and under the different part of the first semiconductor region along the second direction. ### Claim 2 (depends on 1) The photoelectric conversion device according to claim 1, wherein an orthogonal projection of the part having the lower impurity concentration onto a plane parallel to the surface of the semiconductor substrate and an orthogonal projection of the second semiconductor region onto the plane coincide with each other. ### Claim 3 (depends on 1) The photoelectric conversion device according to claim 1, wherein an orthogonal projection of the part having the lower impurity concentration onto a plane parallel to the surface of the semiconductor substrate encompasses an orthogonal projection of the second semiconductor region onto the plane. ### Claim 4 (depends on 1) The photoelectric conversion device according to claim 1, wherein an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate encompasses an orthogonal projection of the part having the lower impurity concentration onto the plane. ### Claim 5 (depends on 1) The photoelectric conversion device according to claim 1, wherein the transfer portion includes a transfer gate electrode, and wherein a distance from a center of an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate to an orthogonal projection of the transfer gate electrode onto the plane is less than a distance from a center of an orthogonal projection of the first semiconductor region onto the plane to the orthogonal projection of the transfer gate electrode onto the plane. ### Claim 6 A photoelectric conversion device comprising: a semiconductor substrate; a photoelectric conversion portion including first and second semiconductor regions of a first conductivity type disposed in the semiconductor substrate, the first semiconductor region including a first part and a second part different from the first part; a transfer portion configured to transfer charges of the first and second semiconductor regions; a third semiconductor region of a second conductivity type disposed over both of the first part and the second part of the first semiconductor region; and a fourth semiconductor region of the second conductivity type, wherein the first part, the fourth semiconductor region, and the second part are arranged in this order along a first direction parallel to a surface of the semiconductor substrate, wherein the second semiconductor region is disposed under the fourth semiconductor region, the second semiconductor region and the fourth semiconductor region being arranged along a second direction perpendicular to the surface, and wherein a length of the first semiconductor region along the first direction is greater than a length of the second semiconductor region along the first direction, and a semiconductor region of the second conductivity type is disposed laterally to the second semiconductor region along the first direction and under the first part and the second part of the first semiconductor region along the second direction. ### Claim 7 (depends on 6) The photoelectric conversion device according to claim 6, wherein an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate and an orthogonal projection of the fourth semiconductor region onto the plane coincide with each other. ### Claim 8 (depends on 6) The photoelectric conversion device according to claim 6, wherein an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate encompasses an orthogonal projection of the fourth semiconductor region onto the plane. ### Claim 9 (depends on 6) The photoelectric conversion device according to claim 6, wherein an orthogonal projection of the fourth semiconductor region onto a plane parallel to the surface of the semiconductor substrate encompasses an orthogonal projection of the second semiconductor region onto the plane. ### Claim 10 (depends on 6) The photoelectric conversion device according to claim 6, wherein the transfer portion includes a transfer gate electrode, and wherein a distance from a center of gravity of an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate to an orthogonal projection of the transfer gate electrode onto the plane is less than a distance from a center of gravity of an orthogonal projection of the first semiconductor region onto the plane to the orthogonal projection of the transfer gate electrode onto the plane. ### Claim 11 A photoelectric conversion device comprising: a semiconductor substrate; a photoelectric conversion portion including first and second semiconductor regions of a first conductivity type disposed in the semiconductor substrate; a transfer portion configured to transfer charges of the first and second semiconductor regions; a third semiconductor region of a second conductivity type disposed over the first semiconductor region; and a fourth semiconductor region of the second conductivity type, wherein the first semiconductor region includes a first part and a second part different from the first part, wherein the first part, the second part, and the fourth semiconductor region are disposed at a same depth, wherein the first part, the fourth semiconductor region, and the second part are arranged in this order along a first direction parallel to a surface of the semiconductor substrate, wherein the second semiconductor region is disposed under the fourth semiconductor region, wherein a length of the first semiconductor region along the first direction is greater than a length of the second semiconductor region along the first direction, wherein the transfer portion includes a transfer gate electrode, and wherein a distance from a center of gravity of an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate to an orthogonal projection of the transfer gate electrode onto the plane is less than a distance from a center of gravity of an orthogonal projection of the first semiconductor region onto the plane to the orthogonal projection of the transfer gate electrode onto the plane. ### Claim 12 (depends on 11) The photoelectric conversion device according to claim 11, wherein an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate and an orthogonal projection of the fourth semiconductor region onto the plane coincide with each other. ### Claim 13 (depends on 11) The photoelectric conversion device according to claim 11, wherein an orthogonal projection of the second semiconductor region onto a plane parallel to the surface of the semiconductor substrate encompasses an orthogonal projection of the fourth semiconductor region onto the plane. ### Claim 14 (depends on 11) The photoelectric conversion device according to claim 11, wherein an orthogonal projection of the fourth semiconductor region onto a plane parallel to the surface of the semiconductor substrate encompasses an orthogonal projection of the second semiconductor region onto the plane.