# US 9,437,635 B2 · Solid-state image sensor, method of manufacturing the same and camera > Agents: this data is available as JSON from the patentgrep API and MCP server — see https://patentgrep.com/llms.txt - Number: US 9,437,635 B2 - Document ID: US9437635B2 - Status: Granted - Kind: B2 - Application number: 14/612,486 - Filed: 2015-02-03 - Published: 2015-05-28 - Granted: 2016-09-06 - Earliest claimed: 2012-11-12 - Assignees: Canon Kabushiki Kaisha - Applicants: Canon Kabushiki Kaisha - Inventors: Takehiko Soda - Web page: https://patentgrep.com/patent/US9437635B2 ## CPC - H10F 39/8067: {Reflectors} - H10F 39/024: {of coatings or optical elements} - H10F 39/199: {Back-illuminated image sensors} - H10F 39/8057: {Optical shielding} - H10F 39/811: {Interconnections} - H10F 39/8053: {Colour filters} - H10F 39/8063: {Microlenses} - H10F: INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION ## Abstract An image sensor includes a semiconductor layer having first and second faces, and a wiring structure arranged on a side of the first face, wherein photoelectric converters are arranged in the semiconductor layer and light is incident on the second face. The wiring structure includes reflection portions having reflection regions and arranged for at least some of the photoelectric converters, absorbing portions arranged around the reflection regions, an insulator portion arranged to surround the absorbing portions, and an interlayer insulating film arranged between the first face and a group of the reflection portions, the light absorbing portions, and the insulator portion, and a reflectance of the light absorbing portions is smaller than a reflectance of the reflection regions, and a light transmittance of the light absorbing portions is smaller than a light transmittance of the insulator portion. ## Claims ### Claim 1 A solid-state image sensor comprising: a semiconductor layer having a first face and a second face, a plurality of photoelectric converters being arranged in the semiconductor layer; a plurality of conductive portions arranged at a side of the first face; a plurality of lenses arranged at a side of the second face; an interlayer insulator film disposed between the plurality of conductive portions and the semiconductor layer; and a barrier metal portion disposed between a conductive portion of the plurality of conductive portions and the interlayer insulator film, wherein a surface of the conductive portion at a side of the semiconductor layer has a first region and a second region out of the first region, the first region and the second region forming a stepped shape in the surface of the conductive portion, and wherein the barrier metal portion has an opening through which the first region of the conductive portion faces the semiconductor layer through the interlayer insulator film so that a part of the conductive portion is provided in the opening, and the barrier metal portion is disposed between the second region and the interlayer insulator film. ### Claim 2 (depends on 1) The solid-state image sensor according to claim 1, wherein the conductive portion is formed of a material selected from a group consisting of aluminum, copper, gold, tungsten, titanium and tantalum. ### Claim 3 (depends on 1) The solid-state image sensor according to claim 1, wherein the barrier metal portion is formed of a material selected from a group consisting of a titanium nitride and a silicon carbide. ### Claim 4 (depends on 1) The solid-state image sensor according to claim 1, further comprising a plurality of barrier metal portions including the barrier metal portion, the plurality of barrier metal portions being separated from each other by an insulator portion. ### Claim 5 (depends on 1) The solid-state image sensor according to claim 1, wherein the first region of the conductive portion is in contact with the interlayer insulator film. ### Claim 6 (depends on 1) The solid-state image sensor according to claim 1, wherein a reflectance of a material of the barrier metal portion is smaller than a reflectance of a material of the first region. ### Claim 7 (depends on 1) The solid-state image sensor according to claim 1, wherein the conductive portion is formed as a part of a wiring pattern for communicating an electric signal. ### Claim 8 A solid-state image sensor, comprising: a semiconductor layer having a first face and a second face; and a wiring structure arranged on the first face, wherein a plurality of photoelectric converters are arranged in the semiconductor layer, wherein light from an object is incident on the photoelectric converters through the second face, wherein the wiring structure includes a conductive portion and a barrier metal portion disposed between the conductive portion and the semiconductor layer, and wherein the barrier metal portion has an opening through which a reflection region of the conductive portion is provided wherein the plurality of photoelectric converters include a first photoelectric converter on which light of a first wavelength range is incident, a second photoelectric converter on which light with a wavelength within a second wavelength range, that is shorter than the first wavelength range, is incident, and a third photoelectric converter on which light with a wavelength within a third wavelength range, that is shorter than the second wavelength range, is incident, and wherein the conductive portion and the barrier metal portion are provided for only the first photoelectric converter or only the first photoelectric converter and the second photoelectric converter. ### Claim 9 (depends on 1) A camera comprising: a solid-state image sensor according to claim 1; and a processor which processes a signal output from the solid-state image sensor. ### Claim 10 A solid-state image sensor comprising: a semiconductor layer having a first face and a second face, a plurality of photoelectric converters being arranged along the first face in the semiconductor layer; a plurality of first patterns arranged on and along the first face; a plurality of lenses arranged at a side of the second face; an interlayer insulator film disposed between the plurality of first patterns and the semiconductor layer; and a second pattern disposed between a first pattern of the plurality of first patterns and the interlayer insulator film, wherein a surface of the first pattern at a side of the semiconductor layer has a first region and a second region out of the first region, the first region and the second region forming a stepped shape in the surface of the first pattern, and wherein the second pattern has an opening through which the first region of the first pattern faces the semiconductor layer through the interlayer insulator film so that a part of the first pattern is provided in the opening, and the second pattern is disposed between the second region and the interlayer insulator film, wherein the first pattern is formed of a material selected from a group consisting of aluminum, copper, gold, tungsten, titanium and tantalum, and the second pattern is formed of a titanium nitride. ### Claim 11 (depends on 8) A camera comprising: a solid-state image sensor according to claim 8; and a processor which processes a signal output from the solid-state image sensor. ### Claim 12 (depends on 10) A camera comprising: a solid-state image sensor according to claim 10; and a processor which processes a signal output from the solid-state image sensor. ### Claim 13 (depends on 1) The solid-state image sensor according to claim 1, wherein the interlayer insulator film is formed of silicon oxide. ### Claim 14 (depends on 10) The solid-state image sensor according to claim 10, wherein the interlayer insulator film is formed of silicon oxide. ### Claim 15 (depends on 10) The solid-state image sensor according to claim 10, wherein the first region of the first pattern is in contact with the interlayer insulator film. ### Claim 16 (depends on 5) The solid-state image sensor according to claim 5, wherein the first region of the conductive portion is in contact with the barrier metal portion. ### Claim 17 (depends on 15) The solid-state image sensor according to claim 15, wherein the second region of the first pattern is in contact with the second pattern.