# US 9,437,006 B2 · Method and system for object reconstruction

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- Number: US 9,437,006 B2
- Document ID: US9437006B2
- Status: Granted
- Kind: B2
- Application number: 14/745,438
- Filed: 2015-06-21
- Published: 2015-10-08
- Granted: 2016-09-06
- Earliest claimed: 2005-10-11
- Assignees: Apple Inc.
- Applicants: Apple Inc.
- Inventors: Zeev Zalevsky; Alexander Shpunt; Aviad Maizels; Javier Garcia
- Web page: https://patentgrep.com/patent/US9437006B2

## CPC

- H10B 41/35: with a cell select transistor, e.g. NAND
- G01B 11/162: {by speckle- or shearing interferometry}
- G01B 11/2441: {using interferometry}
- G01B 11/2513: {with several lines being projected in more than one direction, e.g. grids, patterns}
- G06T 7/521: from laser ranging, e.g. using interferometry; from the projection of structured light
- H04N 13/20: Image signal generators
- H04N 13/254: in combination with electromagnetic radiation sources for illuminating objects
- H10B 41/10: characterised by the top-view layout
- H10D 30/68: Floating-gate IGFETs
- H10D 30/6892: {having at least one additional gate other than the floating gate and the control gate, e.g. program gate, erase gate or select gate}
- H10D 62/125: {Shapes of junctions between the regions}
- H10W 20/20: Interconnections within wafers or substrates, e.g. through-silicon vias [TSV]
- H10W 20/43: Layouts of interconnections
- G06T 2207/10012: Stereo images
- G06T 2207/20056: Discrete and fast Fourier transform, [DFT, FFT]
- H10B: ELECTRONIC MEMORY DEVICES
- G01B: MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G06T: IMAGE DATA PROCESSING OR GENERATION, IN GENERAL
- H04N: PICTORIAL COMMUNICATION, e.g. TELEVISION
- H10D: INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10W: GENERIC PACKAGES, INTERCONNECTIONS, CONNECTORS OR OTHER CONSTRUCTIONAL DETAILS OF DEVICES COVERED BY CLASS H10

## Abstract

A system and method are presented for use in the object reconstruction. The system comprises an illuminating unit, and an imaging unit (see FIG. 1). The illuminating unit comprises a coherent light source and a generator of a random speckle pattern accommodated in the optical path of illuminating light propagating from the light source towards an object, thereby projecting onto the object a coherent random speckle pattern. The imaging unit is configured for detecting a light response of an illuminated region and generating image data. The image data is indicative of the object with the projected speckles pattern and thus indicative of a shift of the pattern in the image of the object relative to a reference image of said pattern. This enables real-time reconstruction of a three-dimensional map of the object.

## Claims

### Claim 1

A system for object reconstruction, comprising:
an illuminating unit, comprising a coherent light source and a generator of a non-periodic pattern comprising a diffractive optical element (DOE) in an optical path of illuminating light propagating from the light source toward an object, thereby projecting the non-periodic pattern onto an object;
an imaging unit configured to detect a light response of an illuminated region and generating image data indicative of the object within the projected pattern; and
a processor, configured to reconstruct a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.

### Claim 2 (depends on 1)

The system according to claim 1, wherein the reference image is acquired at a reference plane oriented normally to the optical path of the illuminating light.

### Claim 3 (depends on 2)

The system according to claim 2, wherein the reference plane is at the same distance from the generator of the non-periodic pattern and from the imaging unit.

### Claim 4 (depends on 1)

The system according to claim 1, wherein the processor is configured to reconstruct the 3D map by determining a correlation between the image data and the reference image.

### Claim 5 (depends on 1)

The system according to claim 1, wherein the DOE is configured to adjust a brightness variation of the projected pattern between different regions in a field of view of the imaging unit.

### Claim 6 (depends on 1)

The system according to claim 1, wherein the projected pattern comprises a Fourier transform of the DOE.

### Claim 7 (depends on 1)

The system according to claim 1, wherein the imaging unit comprises a single light detector having a stationary field of view.

### Claim 8

A method for object reconstruction, comprising:
projecting onto an object a non-periodic pattern formed by a coherent light source and a generator of the non-periodic pattern comprising a diffractive optical element (DOE) in an optical path of illuminating light propagating from the light source toward the object;
detecting a light response of an illuminated region and generating image data indicative of the object within the projected pattern; and
processing the image data so as to reconstruct a three-dimensional (3D) map of the object responsively to a shift of the pattern in the image data relative to a reference image of the pattern.

### Claim 9 (depends on 8)

The method according to claim 8, wherein the reference image is acquired at a reference plane oriented normally to the optical path of the illuminating light.

### Claim 10 (depends on 9)

The method according to claim 9, wherein the reference plane is at the same distance from the generator of the non-periodic pattern and from an imaging unit that detects the light response.

### Claim 11 (depends on 8)

The method according to claim 8, wherein processing the image data comprises reconstructing the 3D map by determining a correlation between the image data and the reference image.

### Claim 12 (depends on 8)

The method according to claim 8, wherein the DOE is configured to adjust a brightness variation of the projected pattern between different regions in a field of view of the imaging unit.

### Claim 13 (depends on 8)

The method according to claim 8, wherein the projected pattern comprises a Fourier transform of the DOE.

### Claim 14 (depends on 8)

The method according to claim 8, wherein detecting the light response comprises capturing an image using a single light detector having a stationary field of view.
