# US 9,435,827 B2 · Probe-connection-type pogo pin and manufacturing method thereof

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- Number: US 9,435,827 B2
- Document ID: US9435827B2
- Status: Granted
- Kind: B2
- Application number: 14/363,111
- Filed: 2012-12-04
- Published: 2014-12-11
- Granted: 2016-09-06
- Earliest claimed: 2011-12-05
- Assignees: Iwin Co., Ltd.
- Applicants: Iwin Co., Ltd.
- Inventors: Sang-Yang Pak
- Web page: https://patentgrep.com/patent/US9435827B2

## CPC

- G01R 1/06722: {Spring-loaded}
- G01R 1/06733: {Geometry aspects (G01R1/06727 takes precedence)}
- G01R 3/00: Apparatus or processes specially adapted for the manufacture {or maintenance} of measuring instruments {, e.g. of probe tips}
- H01R 13/2421: {using coil springs}
- H01R 12/714: {with contacts abutting directly the printed circuit; Button contacts therefore provided on the printed circuit}
- Y10T 29/49208: by assembling plural parts
- G01R: MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES (indicating correct tuning of resonant circuits H03J3/12)
- H01R: ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
- Y10T: TECHNICAL SUBJECTS COVERED BY FORMER US CLASSIFICATION

## Abstract

The present invention relates to a pogo pin including a probe part and an elastic part, and more particularly, to a probe-connection-type pogo pin including a cylindrical upper probe part, an elastic part, and a cylindrical lower probe part, which are made in one body, to transmit electrical signals between semiconductor wafers, LCD modules, semiconductor packages, electronic parts such as a variety of sockets, etc. Accordingly, it is possible to reduce the manufacturing process and the manufacturing cost, reduce the outside diameter of the pogo pin by making the elastic part formed to surround the cylindrical lower probe part, and reduce the loss and distortion of electrical signal by allowing the upper probe part and the lower probe part to come in surface contact with each other.

## Claims

### Claim 1

A probe-connection-type pogo pin including an upper probe part (100), a lower probe part (200), and an elastic part (300) positioned between the upper probe part and the lower probe part, wherein the upper probe part and the lower probe part are connected to each other through the elastic part only,
a) wherein the upper probe part (100) comprises a first body (110) and a tip portion (120) provided on an upper end of the first body (110), the first body including a hollow cylindrical opening portion (130) on a lower end thereof,
b) wherein the lower probe part (200) comprises a second body (210), a tip portion (220) provided on a lower end of the second body (210), and an insertion portion (230) provided on an upper end of the second body (210) and having a diameter enough to be inserted into the opening portion (130), and
c) wherein the elastic part (300) is a spring (310) which has a predetermined elasticity and formed to surround at least an outside of the insertion portion (230) with one end of the spring fixed to a lower side of the lower probe part (200) and with another end of the spring fixed to a lower end of the upper probe part (100),
wherein the insertion portion of the second body may be positioned in the middle of the spring, and
wherein the spring has an electrical path in proportion to the number of turns of the spring and has a spiral structure of a coil causing resistance and inductance components.

### Claim 2 (depends on 1)

The probe-connection-type pogo pin of claim 1, wherein the insertion portion (230) is circular or a circle with at least one opening (250) when viewed in cross section.

### Claim 3 (depends on 1)

The probe-connection-type pogo pin of claim 1, wherein the spring (310) is a one-directional spring which is only wound in one direction.

### Claim 4 (depends on 1)

The probe-connection-type pogo pin of claim 1, wherein the spring (310) is a two-directional spring whose upper and lower portions are wound in different directions to each other.

### Claim 5 (depends on 1)

The probe-connection-type pogo pin of claim 1, wherein the upper probe part (100) or the lower probe part (200) further comprises a fixing portion (140, 240).

### Claim 6 (depends on 1)

The probe-connection-type pogo pin of claim 1, wherein the upper probe part (100), the lower probe part (200), and the elastic part (300) are made in one body.

### Claim 7 (depends on 6)

The probe-connection-type pogo pin of claim 6, wherein the opening portion (130) and the insertion portion (230) are spaced apart from each other when external force is not applied on the elastic part (300).

### Claim 8

A method for manufacturing a probe-connection-type pogo pin including an upper probe part (100), a lower probe part (200′), and an elastic part (300) positioned between the upper probe part and the lower probe part, wherein the upper probe part and the lower probe part are connected to each other through the elastic part only, the method comprising:
a) cutting a metal plate according to planar figures represented on the metal plate, wherein the represented planar figures include a planar figure of upper probe part (100′) with a planar figure of tip portion (120′) formed on an upper end of the planar figure of upper probe part, a planar figure of lower probe part (200′) with a planar figure of tip portion (220′) formed on a lower end of the planar figure of lower probe part, and a planar figure of strip-shaped elastic part (300′) formed to connect the planar figure of upper probe part (100′) and the planar figure of lower probe part (200′) to each other,
b) forming a raw pogo pin made of an upper probe part, a lower probe part and an elastic part, which are made in one body, by forming the lower probe part (200′), which is shaped partly or wholly in cylindrical shape, from a plate of the planar figure of lower probe part (200′) using rolling means, winding the elastic part (300) to surround an outside of the lower probe part (200′), and making the upper probe part (100) shaped partly or wholly in cylindrical shape, and
c) hardening the raw pogo pin through heat treatment and plating the raw pogo pin, and
wherein the probe-connection-type pogo pin further includes a spring which has a predetermined elasticity,
wherein the lower probe part (200′) includes an insertion portion which may be positioned in the middle of the spring, and
wherein the spring has an electrical path in proportion to the number of turns of the spring and has a spiral structure of a coil causing resistance and inductance components.

### Claim 9

A method for manufacturing a probe-connection-type pogo pin including an upper probe part (100), a lower probe part (200′), and an elastic part (300) positioned between the upper probe part and the lower probe part, wherein the upper probe part and the lower probe part are connected to each other through the elastic part only, the method comprising:
a) cutting a metal plate according to planar figures represented on the metal plate, wherein the represented planar figures include a planar figure of upper probe part (100′) with a planar figure of tip portion (120′) formed on an upper end of the planar figure of upper probe part, a planar figure of lower probe part (200′) with a planar figure of tip portion (220′) formed on a lower end of the planar figure of lower probe part, and a planar figure of strip-shaped elastic part (300′) formed to connect the planar figure of upper probe part (100′) and the planar figure of lower probe part (200′) to each other,
b) forming a raw pogo pin made of an upper probe part, a lower probe part and an elastic part, which are made in one body, by forming the upper probe part (100) and the lower probe part (200), which are shaped partly or wholly in cylindrical shape, from a plate of the planar figure of upper probe part (100′) and a plate of the planar figure of lower probe part (200′), respectively, using rolling means, and winding the elastic part (300) to surround an outside of the lower probe part (200), and
c) hardening the raw pogo pin through heat treatment and plating the raw pogo pin,
wherein the probe-connection-type pogo pin further includes a spring which has a predetermined elasticity,
wherein the lower probe part (200′) includes an insertion portion which may be positioned in the middle of the spring, and
wherein the spring has an electrical path in proportion to the number of turns of the spring and has a spiral structure of a coil causing resistance and inductance components.

### Claim 10 (depends on 8)

The method of claim 8, wherein the lower probe part (200) is not inserted into but spaced apart from the upper probe part (100) when external force is not applied on the raw pogo pin.

### Claim 11 (depends on 8)

The method of claim 8, wherein the plating is performed by plating the raw pogo pin with nickel and then with gold.
