Bypass capacitor circuit and method of providing a bypass capacitance for an integrated circuit die

A method of providing a bypass capacitance for an integrated circuit, comprising:

• providing a semiconductor wafer comprising at least two integrated circuit dice on which a respective integrated circuit having an interior region is situated;
• and
• fabricating a bypass capacitor circuit including one or more capacitive devices in a segment of a seal ring area of at least one of said integrated circuit dice, wherein the seal ring area at a peripheral region of the at least one of the integrated circuit dice.

A method of operating an integrated circuit of an integrated circuit die including a bypass capacitor circuit including one or more capacitive devices, each arranged in a segment of a seal ring area of the integrated circuit die, said integrated circuit die comprising said integrated circuit having an interior region, the method comprising:

• in a normal operation mode, providing a bypass capacitance to said integrated circuit depending on a capacitance of one or more of said capacitive devices having an associated operability parameter value indicative of a non-defectiveness of said corresponding capacitive device.