Laser annealing technique for metal oxide TFT
AssigneeQUALCOMM MEMS Technologies, Inc.
InventorsJohn Hyunchul Hong, Tze-Ching Fung, Cheonhong Kim, Kenji Nomura
Life of this patent
Estimating the term…
Loading patent…
AssigneeQUALCOMM MEMS Technologies, Inc.
InventorsJohn Hyunchul Hong, Tze-Ching Fung, Cheonhong Kim, Kenji Nomura
Estimating the term…
This disclosure provides methods and apparatuses for annealing an oxide semiconductor in a thin film transistor (TFT). In one aspect, the method includes providing a substrate with a partially fabricated TFT structure formed on the substrate. The partially fabricated TFT structure can include an oxide semiconductor layer and a dielectric oxide layer on the oxide semiconductor layer. The oxide semiconductor layer is annealed by heating the dielectric oxide layer with an infrared laser under ambient conditions to a temperature below the melting temperature of the oxide semiconductor layer. The infrared laser radiation can be substantially absorbed by the dielectric oxide layer and can remove unwanted defects from the oxide semiconductor layer at an interface in contact with the dielectric oxide layer.
A method to make a thin film transistor (TFT), the method comprising:
A method to make a thin film transistor (TFT), the method comprising:
Dependencies are inferred from the claim text.