Scalable and uniformity controllable diffusion plasma source
AssigneeTokyo Electron Limited
InventorsJianping Zhao, Lee Chen, Radha Sundararajan, Merritt Funk
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AssigneeTokyo Electron Limited
InventorsJianping Zhao, Lee Chen, Radha Sundararajan, Merritt Funk
Estimating the term…
A method of treating a substrate with plasma is described. In particular, the method includes disposing a substrate in a plasma processing system, disposing a hollow cathode plasma source including at least one hollow cathode within the plasma processing system, and disposing a grid between the cathode outlet of the plurality of hollow cathodes and the substrate. The method further includes electrically coupling the grid to electrical ground, coupling a voltage to the at least one hollow cathode relative to electrical ground, and generating plasma in hollow cathode by ion-induced secondary electron emission of energetic electrons that move along a first trajectory, and diffusing lower energy electrons along a second trajectory across a first region of the interior space between the cathode outlet and the grid, through the grid, and into a second region of the interior space in fluid contact with the substrate.
A method of treating a substrate with plasma, comprising:
A method of treating a substrate with plasma, comprising:
A method of treating a substrate with plasma, comprising:
Dependencies are inferred from the claim text.