Timing-drift calibration

A method of operation of an integrated circuit device that controls the operation of a memory device, the method comprising:

• transmitting a plurality of timing calibration instructions to trigger a plurality of frequency measurements in the memory device;
• receiving a plurality of count values representing a plurality of measured frequencies of an internal ring oscillator in the memory device, wherein a change in the measured frequencies of the internal ring oscillator is indicative of a change in a timing delay in a clock tree structure of a clock distribution circuit in the memory device;
• and
• the integrated circuit device determining a timing drift of the memory device based on the plurality of measured frequencies.

A method of performing timing drift measurement in a memory device, the method comprising:

• periodically measuring a timing drift of the memory device, wherein the timing drift is based on a plurality of measured frequencies of an oscillation circuit in the memory device, wherein a change in the measured frequencies of the oscillation circuit is indicative of a change in a timing delay in a clock distribution circuit in the memory device, and after each measurement:
• comparing the timing drift to a threshold value;
• and
• performing, by an integrated circuit device, a timing calibration on the memory device in response to the timing drift being greater than the threshold value.