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US 9,431,119 B2Granted
Adjustable read time for memory
AssigneeSanDisk Technologies LLC
InventorsJea Woong Hyun, Barrett Edwards, David Nellans
Life of this patent
Estimating the term…
Abstract
Apparatuses, systems, methods, and computer program products are disclosed for controlling a read time of an electronic memory device. A method includes reading data from an integrated circuit of storage using a read time for the integrated circuit of storage. A method includes adjusting a read time for an integrated circuit of storage. A method includes reading data from a same integrated circuit of storage using an adjusted read time for the integrated circuit of storage.
Claims20
A method comprising:
- reading data from an integrated circuit of storage using a read time for the integrated circuit of storage;
- adjusting the read time for the integrated circuit of storage;
- and
- reading data from the same integrated circuit of storage using the adjusted read time for the integrated circuit of storage.
1 more element
An apparatus comprising:
- a read module configured to read data from a memory chip;
- and
- a read configuration module configured to change a read time of the memory chip such that the read module reads data from the memory chip using the changed read time, the change in the read time increasing an error rate for the memory chip.
A system comprising:
- at least one die comprising an array of memory elements;
- a memory control manager for the at least one die, the memory control manager comprising a register that receives a setting for a read time for the array of memory elements of the at least one die from a controller for the at least one die.
Dependencies are inferred from the claim text.