Determining and storing bit error rate relationships in spin transfer torque magnetoresistive random-access memory (STT-MRAM)

A method of managing memory, the method comprising:

• determining a performance characteristic of a memory based on a relationship between two or more of:
• a bit error rate, a programming pulse width, a temperature, a history-based predictive performance parameter, a coding scheme for data, or a voltage level associated with the memory, wherein the programming pulse width is a length of a pulse used to write the data;
• storing the performance characteristic in the memory;
• and
• managing a write operation associated with the memory based on the performance characteristic and based on a number of data flips that are to be performed in response to a determination that the temperature is above a first threshold value, wherein the number of data flips is based on an exclusive-OR operation;
• and
• determining the programming pulse width and subsequently performing one of:
• a long write operation in response to a determination that the number of data flips is greater than a second threshold value or a short write operation in response to a determination that the number of data flips is less than the second threshold value.

A method of managing memory, the method comprising:

• determining a performance characteristic of a memory based on a relationship between a programming pulse width, and one or more of:
• a bit error rate, a temperature, a history-based predictive performance parameter, a coding scheme for data, or a voltage level associated with the memory, wherein the programming pulse width is a length of a pulse used to write the data;
• storing the performance characteristic in the memory;
• managing a write operation associated with the memory based on the performance characteristic and based on a number of data flips that are to be performed in response to a determination that the temperature is above a first threshold value, wherein the number of data flips is based on an exclusive-OR operation;
• and
• determining the programming pulse width and subsequently performing one of:
• a long write operation in response to a determination that the number of data flips is greater than a second threshold value or a short write operation in response to a determination that the number of data flips is less than the second threshold value.