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US 9,430,685 B2Granted
Substrate markings
AssigneeIntel Corporation
InventorsSergei Voronov, Rose Mulligan, Sarita Evans
Life of this patent
Estimating the term…
Abstract
Apparatus, systems, and methods are provided to generate markings on the side of a substrate. The markings represent information. In an embodiment, the information provided in the markings may be used to collect information during an assembly process.
Claims19
A method comprising:
- providing a substrate, the substrate having a surface on which to hold an integrated circuit, the substrate having a side at an angle to the surface such that the side defines a thickness of the substrate;
- and
- generating markings on the side of the substrate, the markings being representative of information.
A method including:
- decoding markings on a side of a substrate, the substrate having a surface on which to hold an integrated circuit, the side of the substrate being at an angle to the surface such that the side defines a thickness of the substrate, the markings being representative of information;
- analyzing results from decoding the markings;
- and
- storing data in a memory, the data correlated to decoding the markings and/or analyzing the results.
1 more element
A system comprising:
- a laser to generate a laser beam;
- a galvo scanner to scan the laser beam along a side of a substrate, the substrate having a surface on which to hold an integrated circuit, the side of the substrate being a side at an angle to the surface such that the side defines a thickness of the substrate;
- and
- control circuitry to regulate the galvo scanner to generate markings on the side of the substrate, the markings representative of information.
1 more element
Dependencies are inferred from the claim text.