US 9,429,617 B2Granted

Testing apparatus for light emitting diodes

AssigneeChroma Ate Inc.

InventorsI-Shih Tseng, Tien-Teng Chang, Jeff Lee, Chih-Yu Cheng, Hsu-Ting Cheng

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Abstract

A testing apparatus for flip chip LEDs includes a transparent substrate, a spacing member, a flexible transparent carrier, and a vacuum generator. The spacing member is configured on a first surface of the transparent substrate. The flexible transparent carrier is removably assembled to the spacing member so that a closed space is formed by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate. The vacuum generator is connected to the closed space for pumping air out of the closed space, and then a part of the transparent substrate clings to the first surface to form a testing area for loading the flip chip LED.

Claims8

Dependent claims

A testing apparatus for a flip chip LED, comprising:

a transparent substrate having a first surface;
a spacing member configured on the first surface of the transparent substrate;
a flexible transparent carrier removably assembled to the spacing member for forming a closed space by the flexible transparent carrier, the spacing member, and the first surface of the transparent substrate;
and
a vacuum generator connected to the closed space for pumping air out of the closed space;
wherein when the transparent substrate is assembled to the spacing member and the vacuum generator pumps air out of the closed space, a part of the flexible transparent carrier clings to the first surface of the transparent substrate to form a testing area for loading the flip chip LED, and there is no opening on a part of the first surface of the transparent substrate where the testing area is located.

3 more elements

Dependencies are inferred from the claim text.