Current measurement and control of a semiconductor element based on the current measurement in a power semiconductor arrangement

A method configured to measure the current through a semiconductor arrangement that comprises a multiplicity of semiconductor elements with controlling paths and controlled paths, the controlled paths having controllable conductivities and being connected parallel to each other, the method comprising:

• measuring current strengths of currents present in the controlled paths and providing a signal representing the sum of the measured current strengths;
• and
• controlling the conductivities of the controlled paths in accordance with an input signal and a signal representing the sum of the current strengths, wherein at least one controlled path is controlled to have minimum conductivity if the signal representing the sum of the current strengths is below a threshold value.

A method configured to measure the current through a semiconductor arrangement that comprises a semiconductor element with a controlling path and a controlled path, the controlled path having a controllable conductivity, wherein at least one shunt resistor provides a resistance and is connected in series with the controlled path and wherein a voltage over the at least one shunt resistor represents the current present in the controlled path, the method comprising:

• measuring the current strength of a current present in the controlled path and providing a signal that represents the measured current strength by evaluating a voltage over the at least one shunt resistor;
• and
• controlling, in accordance with the signal representing the current strength, the resistance provided by the at least one shunt resistor.