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US 9,429,593 B2Granted
Testing head for a test equipment of electronic devices
AssigneeTechnoprobe S.P.A.
InventorRoberto Crippa
Life of this patent
Estimating the term…
Abstract
A testing head for a test equipment of electronic devices comprises a plurality of contact probes inserted into guiding holes made in at least one upper guide and in a lower guide, separate from one another by an air zone, the contact probes comprising at least one enlarged portion suitable for preventing the escape of such probes from the guiding holes. Conveniently, the enlarged portions of the contact probes adjacent according to a direction of distribution of contact pads of an integrated device to be tested have respective larger sides orthogonal to one another.
Claims18
A testing head for test equipment for testing electronic devices comprising:
- an upper guide provided with guiding holes;
- a lower guide provided with guiding holes;
- and
- a plurality of contact probes inserted in the guiding holes of the upper and lower guides, wherein:
- the upper and lower guides are separated from each other by an air zone;
- each contact probe includes a probe body extending through the upper and lower guides and the air zone and an enlarged portion suitable for preventing escape of the contact probe from the guiding holes of the upper and lower guides, the enlarged portion being positioned above the upper guide that the upper guide is between the enlarged portion and the air zone and the enlarged portion having first and second cross-sectional dimensions, the first cross-sectional dimension being larger than the second cross-sectional dimension and being larger than a largest cross-sectional dimension of the probe body;
- and
- the first cross-sectional dimensions of the enlarged portions of adjacent contact probes along a direction of distribution of contact pads of an integrated device to be tested are orthogonal to one another.
5 more elements
A testing head for test equipment for testing electronic devices comprising:
- an upper guide provided with guiding holes;
- a lower guide provided with guiding holes, the upper and lower guides being separated from each other by an air zone;
- and
- a plurality of contact probes inserted in the guiding holes of the upper and lower guides, each contact probe comprising:
- a probe body extending through the upper and lower guides and the air zone;
- an enlarged portion suitable for preventing escape of the contact probe from the guiding holes of the upper and lower guides, the enlarged portion being positioned above the upper guide such that the upper guide is between the enlarged portion and the air zone and the enlarged portion having first and second cross-sectional dimensions, the first cross-sectional dimension being large than the second cross-sectional dimension and being larger than a largest cross-sectional dimension of the probe body;
- and
- a tip portion including a blade for contact with a bump of a plurality of bumps in correspondence with contact pads of an integrated device to be tested,
- wherein the first cross-sectional dimensions of the enlarged portions of adjacent contact probes along a direction of distribution of the contact pads of the integrated device to be tested are orthogonal to one another.
6 more elements
A testing device, comprising:
- a space transformer;
- and
- a testing head positioned adjacent to the space transformer and including:
- an upper guide provided with guiding holes;
- a lower guide provided with guiding holes, the upper and lower guides being separated from each other by an air zone;
- and
- a plurality of contact probes inserted in the guiding holes of the upper and lower guides, each contact probe comprising:
- a probe body extending through the upper and lower guides and the air zone;
- an enlarged portion suitable for preventing escape of the contact probe from the guiding holes of the upper and lower guides, the enlarged portion being positioned in an upper zone between the upper guide and the space transformer and the enlarged portion having first and second cross-sectional dimensions, the first cross-sectional dimension being larger than the second cross-sectional dimension and being larger than a largest cross-sectional dimension of the probe body;
- and
- a tip portion including a blade for contact with a bump of a plurality of bumps in correspondence with contact pads of an integrated device to be tested, wherein the first cross-sectional dimensions of the enlarged portions of adjacent contact probes along a direction of distribution of the contact pads of the integrated device to be tested are orthogonal to one another.
8 more elements
Dependencies are inferred from the claim text.