Microparticle measuring apparatus
AssigneeSony Corporation
InventorsTaichi Takeuchi, Shingo Imanishi
Life of this patent
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AssigneeSony Corporation
InventorsTaichi Takeuchi, Shingo Imanishi
Estimating the term…
A microparticle measuring apparatus for highly accurately detecting the position of a microparticle flowing through a flow channel includes a light irradiation unit for irradiating a microparticle flowing through a flow channel with light, and a scattered light detection unit for detecting scattered light from the microparticle, including an objective lens for collecting light from the microparticle, a light splitting element for dividing the scattered light from the light collected by the objective lens, into first and second scattered light, a first scattered light detector for receiving an S-polarized light component, and an astigmatic element disposed between the light splitting element and the first scattered light detector, and making the first scattered light astigmatic. A relationship between a length L from a rear principal point of the objective lens to a front principal point of the astigmatic element, and a focal length f of the astigmatic element satisfies the following formula I. 1.5f≦L≦2.5f (I)
A microparticle measuring apparatus comprising:
Dependencies are inferred from the claim text.