Scanning projective lensless microscope system
AssigneeCalifornia Institute of Technology
InventorsGuoan Zheng, Samuel Yang, Seung Ah Lee, Changhuei Yang
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Abstract
A scanning projective lensless microscope device comprises a specimen surface, a scanning illumination source with a light element, a light detector outside the specimen surface, and a processor. The scanning illumination source scans the light element to a plurality of scanning locations to provide illumination to an object on the specimen surface. The light detector samples a sequence of sub-pixel shifted projection object images corresponding to the plurality of scanning locations. The processor constructs a high resolution image of the object based on the sequence of sub-pixel shifted projection images and a motion vector of the projections at a plane of interest.
Claims24
A scanning projective lensless microscope device, comprising:
- a specimen surface;
- an illumination source configured to provide illumination incident to a specimen located on the specimen surface, the illumination provided to the specimen from one side of the specimen surface, wherein the illumination is incident to the specimen at a plurality of illumination angles sequentially;
- a light detector configured to receive, from an opposite side of the specimen surface, illumination from the illumination source and passing through the specimen, wherein the light detector is further configured to sample a sequence of sub-pixel shifted projection images of the specimen while the specimen is being illuminated at the plurality of illumination angles sequentially, wherein each sub-pixel shifted projection image is sampled at a different sample time while the illumination source provides illumination at one of the illumination angles and each sub-pixel projection image is based on the illumination passing through the specimen;
- and
- a processor that constructs a high resolution image of the specimen using the sampled sequence of sub-pixel shifted projection images,
- wherein the scanning projective lensless microscope device does not have a lens in an illumination path between the illumination source and the specimen being imaged and does not have a lens in another illumination path between the specimen being imaged and the light detector.
A method of generating a high resolution image of a specimen using a scanning projective lensless microscope device comprising a specimen surface, an illuminating display, a light detector, and a processor, the method comprising:
- receiving a specimen on the specimen surface;
- sequentially illuminating different sets of one or more pixels of the illuminating display to provide illumination incident to the specimen at a plurality of illumination angles at different sample times, wherein the illumination is provided to the specimen from one side of the specimen surface;
- receiving, at a light detector, illumination passing through the specimen from the illumination display, wherein the scanning projective lensless microscope device does not have a lens in an illumination path between the illuminating display and the specimen being imaged and does not have a lens in another illumination path between the specimen being imaged and the light detector;
- sampling a sequence of sub-pixel shifted projection images while the specimen is illuminated at the plurality of illumination angles sequentially, wherein each sub-pixel shifted projection image is sampled at a different sample time while the illuminating display provides illumination at one of the illumination angles and each sub-pixel shifted projection image is based on illumination passing through the specimen;
- and
- constructing a high resolution image of the specimen using the sampled sequence of sub-pixel shifted projection images.
Dependencies are inferred from the claim text.