In-band optical signal-to-noise ratio measurement
AssigneeAlcatel Lucent
InventorsPing W. Wan, Derrick Remedios
Life of this patent
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AssigneeAlcatel Lucent
InventorsPing W. Wan, Derrick Remedios
Estimating the term…
Various embodiments relate to an in-band measurement of the optical signal-to-noise ratio (OSNR) of an optical signal in an optically-amplified transmission system. A demodulation device may tap a transmission fiber to receive an optical signal containing a low-frequency signal. A filter may implement first and second passbands to filter portions of an optical channel in the optical signal. Once the filtered channel is converted to first and second target electrical signals, a measurement circuit may take measurements of DC and AC components for each of the target electrical signals. Based on measurements of the two target electrical signals, the demodulation device may calculate the OSNR as a function of the DC and AC components, or as a function of the adjustment factors between first and second passbands of the optical channel represented by the first and second target electrical signals.
A method for in-band measurement of an optical signal-to-noise ratio (OSNR) by a demodulation device, the method comprising:
A demodulation device for in-band measurement of an optical signal-to-noise ratio (OSNR), the device comprising:
Dependencies are inferred from the claim text.