Method for detecting hysteresis characteristic of comparator and semiconductor device
AssigneeFujitsu Limited
InventorYanfei Chen
Life of this patent
Estimating the term…
Abstract
A method for detecting a hysteresis characteristic of a comparator, include: causing a controller to control an offset adjuster configured to adjust an offset amount of the comparator; causing the controller to change the offset amount from a first value toward a second value and detect a third value when a logic level of a signal output from the comparator is changed; causing the controller to change the offset amount from the second value toward the first value and detect a fourth value when the logic level is changed; and causing the controller to detect the hysteresis characteristic of the comparator based on a first difference between the third value and the fourth value.
Claims7
A method for detecting a hysteresis characteristic of a comparator, comprising:
- causing a controller to control an offset adjuster configured to adjust an offset amount of the comparator;
- causing the controller to change the offset amount from a first value toward a second value and detect a third value when a logic level of a signal output from the comparator is changed;
- causing the controller to change the offset amount from the second value toward the first value and detect a fourth value when the logic level is changed;
- and
- causing the controller to detect the hysteresis characteristic of the comparator based on a first difference between the third value and the fourth value.
A semiconductor device comparing:
- a comparator configured to compare a value of a first input signal with a value of a second input signal and output a result of the comparison;
- an offset adjuster configured to adjust an offset amount of the comparator;
- and
- a controller configured to control the offset adjuster, change the offset amount from a first value toward a second value, detect a third value upon a change in a logic level of a signal output from the comparator, change the offset amount from the second value toward the first value, detect a fourth value upon a change in the logic level, and detect a hysteresis characteristic of the comparator based on a difference between the third value and the fourth value.
Dependencies are inferred from the claim text.