US 9,425,772 B2 · Coupling resistance and capacitance analysis systems and methods

Abstract

The described systems and methods can facilitate examination of device parameters including analysis of relatively dominant characteristic impacts on delays. In one embodiment, at least some coupling components (e.g., metal layer wires, traces, lines, etc.) have a relatively dominant impact on delays and the delay is in part a function of both capacitance and resistance of the coupling component. In one embodiment, a system comprises a plurality of dominant characteristic oscillating rings, wherein each respective one of the plurality of dominant characteristic oscillating rings includes a respective dominant characteristic. Additional analysis can be performed correlating the dominant characteristic delay impact results with device fabrication and operation.

Claims19

Dependent claims

A system comprising:

a plurality of dominant characteristic oscillating rings, wherein each respective one of the plurality of dominant characteristic oscillating rings includes at least one dominant characteristic inversion stage with a respective dominant characteristic based upon:
a coupling resistance relative to a channel resistance;
and
a coupling capacitance relative to a coupling capacitance of another respective one of the plurality of dominant characteristic oscillating rings;
and
an analysis component operable to analyze an indication of the respective dominant characteristic associated with each respective one of the plurality of dominant characteristic oscillating rings and also operable to perform analysis based upon combined results from the each respective one of the plurality of dominant characteristic oscillating rings.

3 more elements

Dependencies are inferred from the claim text.

Coupling resistance and capacitance analysis systems and methods

Life of this patent

Coupling resistance and capacitance analysis systems and methods

Life of this patent

Abstract

Claims19