Use of capacitance to analyze polycrystalline diamond

A capacitance measuring system, comprising:

• a capacitance measuring device comprising a positive terminal and a negative terminal;
• a leached polycrystalline diamond compact cutter comprising a polycrystalline structure and a substructure, the polycrystalline structure comprising a leached layer and an unleached layer positioned adjacent to the leached layer, the leached layer having at least a portion of a catalyst material removed from therein;
• a first conducting component for contacting a first surface of the leached polycrystalline diamond compact cutter;
• a first wire for electrically coupling the positive terminal to the first conducting component;
• a second conducting component for contacting a second surface of the leached polycrystalline diamond compact cutter, the second surface being positioned opposite of the first surface;
• a second wire for electrically coupling the negative terminal to the second conducting component;
• and
• a press for firmly engaging the conducting components with the respective surfaces to form a circuit,
• wherein the capacitance measuring device is operable to measure a capacitance of the leached polycrystalline diamond compact cutter via the circuit.