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US 9,404,798 B2Granted
Control apparatus and control method having a slit selection based upon acquired half value wavelength of incident spectrum
AssigneeNEC Corporation
InventorHideya Tomita
Life of this patent
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Abstract
A control apparatus includes a slit plate including a plurality of rectangular slits with different widths. The control apparatus also includes an acquisition unit which acquires an incident spectrum from the rectangular slit. The apparatus also includes a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum, and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
Claims14
A control apparatus comprising:
- a slit plate which includes a plurality of rectangular slits with different widths;
- an acquisition unit which acquires an incident spectrum from the rectangular slit;
- and
- a slit selecting unit which acquires a half value wavelength of the incident spectrum on the basis of the incident spectrum and performs a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
1 more element
A method for controlling an apparatus, the method comprising:
- acquiring an incident spectrum obtained from incident light which passes through a rectangular slit, wherein the rectangular slit is included in a plurality of rectangular slits with different widths, wherein the plurality of rectangular slits are arranged in a slit plate of the apparatus;
- and
- calculating a half value wavelength of the incident spectrum;
- and
- performing a selection of one of the plurality of rectangular slits on the basis of the half value wavelength.
2 more elements
An apparatus comprising:
- an acquisition means for acquiring an incident spectrum obtained from incident light which passes through a rectangular slit, wherein the rectangular slit is included in a plurality of rectangular slits with different widths, wherein the plurality of rectangular slits are arranged in a slit plate of the apparatus;
- and
- a selecting means for calculating a half value wavelength of the incident spectrum, and selecting one of the plurality of rectangular slits on the basis of the half value wavelength.
Dependencies are inferred from the claim text.