Semiconductor crystal removal apparatus and production method for semiconductor crystal

A semiconductor crystal removal apparatus for removing a Group III nitride semiconductor crystal from a crucible, the crystal having been produced in the crucible through the flux process, the semiconductor crystal removal apparatus comprising:

• a crucible-supporting unit for supporting the crucible so that an opening of the crucible is directed downward;
• a heating unit for heating the crucible supported by means of the crucible-supporting unit;
• a semiconductor crystal-receiving unit for receiving the semiconductor crystal falling from the opening of the crucible;
• a miscellaneous crystal-receiving unit for receiving miscellaneous crystals contained in a flux, the miscellaneous crystal-receiving unit being located below the semiconductor crystal-receiving unit;
• a weight-measuring unit for measuring the weight of the crucible-supporting unit or the semiconductor crystal-receiving unit;
• and
• a determination portion for determining whether or not the semiconductor crystal has been removed from the crucible, wherein the determination portion determines that the semiconductor crystal has been already removed from the crucible when a change in weight as measured by means of the weight-measuring unit is equal to or greater than a predetermined threshold, or determines that the semiconductor crystal has not yet been removed from the crucible when a change in weight as measured by means of the weight measuring unit is less than the predetermined threshold.